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Symbolic Quick Error Detection for Pre-Silicon and Post-Silicon Validation: Frequently Asked Questions

机译:硅前和硅后验证的符号快速错误检测:常见问题

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摘要

Reducing the error detection latency is critical for improving the design visibility while searching for design errors. This article uses a FAQ format to discuss the key points of the symbolic QED method that can be applied during both pre-silicon and post-silicon validation.
机译:减少错误检测延迟对于搜索设计错误时提高设计可见性至关重要。本文使用FAQ格式来讨论可在硅前和硅后验证中应用的符号QED方法的关键点。

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