Automated Selection of Assertions for Bit-Flip Detection During Post-Silicon Validation

摘要

Post-silicon validation deals with detection and diagnosis of errors that, due to existing limitations in pre-silicon verification, escape to the silicon prototypes and need to be fixed before committing to high-volume manufacturing. Electrical errors, such as those caused by cross-talk or power droops, are particularly difficult to catch during the pre-silicon phase because of the insufficient accuracy of device models, which is often traded-off against simulation time. This challenge is further aggravated by the rising number of voltage domains, especially if subtle errors are excited in unique electrical states. In fact these electrically-induced subtle errors most commonly manifest in the logic domain as bit-flips and, to the best of our knowledge, there are no systematic methods for designing embedded hardware monitors for generic logic blocks that can detect bit-flips with low detection latency. Moreover, unlike pre-silicon verification and manufacturing test that benefit from well-defined and universally accepted coverage metrics, there is no generic metric from which confidence can be implied at the end of post-silicon validation. Toward these goals, we present a method that relies on design invariants (assertions) that are ranked based on their potential to detect bit-flips. We also introduce two metrics bit-flip coverage estimate and flip-flop coverage estimate that can be used to assess the quality of the selected assertions, and, in general, the effectiveness of the post-silicon validation process.