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POST-SILICON VALIDATION AND DEBUG USING SYMBOLIC QUICK ERROR DETECTION

机译:使用符号快速错误检测进行硅后验证和调试

摘要

Disclosed are improved methods and structures for verifying integrated circuits and in particular systems-on-a-chip constructed therefrom. We call methods and structures according to the present disclosure Symbolic Quick Error Detection or Symbolic QED, Illustrative characteristics of Symbolic QED include: 1) It is applicable to any System-on-Chip (SoC) design as long as it contains at least one programmable processor; 2) It is broadly applicable for logic bugs inside processor cores, accelerators, and uncore components; 3) It does not require failure reproduction; 4) It does not require human intervention during bug localization; 5) It does not require trace buffers, 6) It does not require assertions; and 7) It uses hardware structures called “change detectors” which introduce only a small area overhead. Symbolic QED exhibits: 1) A systematic (and automated) approach to inserting “change detectors” during a design phase; 2) Quick Error Detection (QED) tests that detect bugs with short error detection latencies and high coverage; and 3) Formal techniques that enable bug localization and generation of minimal bug traces upon bug detection.
机译:公开了用于验证集成电路并且特别是由其构造的片上系统的改进的方法和结构。我们将根据本公开的方法和结构称为符号快速错误检测或符号QED,符号QED的说明性特征包括:1)适用于任何片上系统(SoC)设计,只要它包含至少一个可编程的处理器; 2)广泛适用于处理器核心,加速器和非核心组件内部的逻辑错误; 3)不需要故障再现; 4)在错误定位期间不需要人工干预; 5)不需要跟踪缓冲区,6)不需要断言; 7)它使用称为“变化检测器”的硬件结构,该结构仅带来很小的区域开销。 QED的象征意义在于:1)在设计阶段插入“变化检测器”的系统(自动)方法; 2)快速错误检测(QED)测试,以较短的错误检测延迟和较高的覆盖率检测错误;和3)正式的技术,可以使错误本地化并在检测到错误时生成最少的错误跟踪。

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