首页> 外文期刊>Computers & mathematics with applications >An improved immersed finite element particle-in-cell method for plasma simulation
【24h】

An improved immersed finite element particle-in-cell method for plasma simulation

机译:一种改进的浸入式有限元等离子体模拟方法

获取原文
获取原文并翻译 | 示例

摘要

The particle-in-cell (PIC) method has been widely used for plasma simulation, because of its noise-reduction capability and moderate computational cost. The immersed finite element (IFE) method is efficient for solving interface problems on Cartesian meshes, which is desirable for the PIC method. The combination of these two methods provides an effective tool for plasma simulation with complex interface/boundary. This paper introduces an improved IFE-PIC method that enhances the performance in both IFE and PIC aspects. For the electric field solver, we adopt the newly developed partially penalized IFE method with enhanced accuracy. For PIC implementation, we introduce a new interpolation technique to ensure the conservation of the charge. Numerical examples are provided to demonstrate the features of the improved IFE-PIC method. (C) 2017 Elsevier Ltd. All rights reserved.
机译:单元粒子(PIC)方法由于其降噪能力和适中的计算成本而被广泛用于等离子体仿真。浸入式有限元(IFE)方法对于解决笛卡尔网格上的界面问题非常有效,这是PIC方法所需要的。这两种方法的结合为复杂的界面/边界的等离子体仿真提供了有效的工具。本文介绍了一种改进的IFE-PIC方法,该方法可增强IFE和PIC方面的性能。对于电场解算器,我们采用了新开发的具有部分精确度的IFE方法。对于PIC实施,我们引入了一种新的插值技术以确保节省电荷。提供了数值示例来说明改进的IFE-PIC方法的功能。 (C)2017 Elsevier Ltd.保留所有权利。

著录项

  • 来源
    《Computers & mathematics with applications》 |2018年第6期|1887-1899|共13页
  • 作者单位

    Harbin Inst Technol, Shenzhen Grad Sch, Dept Mech Engn & Automat, Shenzhen 518055, Guangdong, Peoples R China;

    Harbin Inst Technol, Shenzhen Grad Sch, Dept Mech Engn & Automat, Shenzhen 518055, Guangdong, Peoples R China;

    Harbin Inst Technol, Shenzhen Grad Sch, Dept Mech Engn & Automat, Shenzhen 518055, Guangdong, Peoples R China;

    Mississippi State Univ, Dept Math & Stat, Mississippi State, MS 39762 USA;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Plasma simulation; IFE-PIC; Interface problem; Particle interpolation;

    机译:等离子体仿真;IFE-PIC;界面问题;粒子插值;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号