An Area-Efficient Current-Mode Bandgap Reference With Intrinsic Robust Start-Up Behavior

摘要

During mass production, bandgap reference failure can cause chip failure, resulting in yield loss. A bandgap reference with robust start-up behavior is therefore needed. In this brief, the issue of multiple operating points is examined, along with a prior art low-voltage current-mode bandgap reference (CMBGR) structure. A CMBGR structure with only two stable operating points is proposed, which can be reliably started up with a very simple pulse generator circuit and a power-up signal. The bandgap reference is implemented in 40-nm technology, achieving a 41.5-ppm/°C nominal temperature coefficient. The current consumption is 40 and the active area is 0.0094 mm .