首页> 外文期刊>Circuitree >Fine Lines in High Yield (Part CLXXXI)
【24h】

Fine Lines in High Yield (Part CLXXXI)

机译:高产细线(CLXXXI部分)

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

Many users of aqueous photoresists have experienced the accumulation of solids in the acid etching equipment. These solids are usually greenish-black in color and tar-like in consistency. Analyses have identified these residues as predominantly organic, consisting of photoresist components and antifoam ingredients, such as poly-glycols that are added to the developer for foam control. These organic residues are not specific to a particular type of aqueous dry film photoresist or liquid photoresist.The etcher residue, often referred to as "goo" because of its tarry consistency, builds up over time and collects on the etcher walls near the surface of the etcher liquid level, and it is very difficult to remove. This residue also can enter the etcher spray system and deposit on conveyor wheels and panel guides. From there, it can redeposit on panel surfaces, acting as etch resist and causing excess copper and short defects on inner-layers.
机译:水性光致抗蚀剂的许多用户已经经历了酸蚀刻设备中固体的积累。这些固体通常呈绿黑色,稠度类似焦油状。分析已经确定这些残留物主要是有机的,由光致抗蚀剂组分和消泡剂成分组成,例如添加到显影剂中以控制泡沫的聚乙二醇。这些有机残留物对特定类型的水性干膜光致抗蚀剂或液体光致抗蚀剂不是特定的。蚀刻残留物,由于其焦油稠度而常被称为“粘稠”,随时间累积并聚集在靠近表面的蚀刻壁上蚀刻液的液位,很难去除。这些残留物也可能进入蚀刻机喷涂系统并沉积在传送轮和面板导轨上。从那里开始,它可以重新沉积在面板表面上,用作抗蚀剂,并导致过多的铜和内层上的短路缺陷。

著录项

  • 来源
    《Circuitree》 |2011年第1期|p.1214|共2页
  • 作者

    Karl Dietz;

  • 作者单位
  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号