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首页> 外文期刊>IEEE transactions on automation science and engineering >Soft-Acting, Noncontact Gripping Method for Ultrathin Wafers Using Distributed Bernoulli Principle
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Soft-Acting, Noncontact Gripping Method for Ultrathin Wafers Using Distributed Bernoulli Principle

机译:用分布式伯努利原理的超薄晶圆的软作用,非接触式抓握方法

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摘要

The handling of ultrathin wafers (<100 mu m thickness) is a challenging task since these are among the thinnest and most fragile materials. This paper provides a soft-acting and noncontact gripping technology for ultrathin wafer based on the distributed Bernoulli principle, and also proposes an experimental measurement method for evaluating the performance. A distributed Bernoulli gripper for ultrathin wafers is designed, and the characteristics of the gripper are studied via theoretical analysis and experiments. Three performance indices for evaluating the properties of the soft gripping: deformation, vibration, and stress are presented. Through measurement experiments, the effects of the key operational parameters consisting of air flow rate and gap height on the performance indices are investigated. Based on the experimental data, the appropriate parameters settings are obtained. The comparison to present grippers reveals that the proposed gripping technology is superior in soft gripping thin and fragile materials. This paper provides guidance for implementing the distributed Bernoulli principle in practical applications of soft-acting and noncontact gripping for thin and fragile materials.Note to Practitioners-This research of developing a new soft-acting and noncontact gripper was motivated by the problem of gripping of fragile workpieces like ultrathin wafers. The traditional contact handling method often leads to defective products including cracks, contact contamination, or mechanical wears, and the existing Bernoulli gripper has the shortcoming of resulting in large deformation as the impact of center negative pressure force, and the collision of wafer onto the gripper as the sharp lifting force curve. In this paper, we propose a soft-acting and noncontact gripper for ultrathin wafer based on the distributed Bernoulli principle. A systematic approach which consists of modeling, measurement, and evaluation is provided for the gripping techniques. We present three performance indices for evaluating the characteristics of soft gripping, and experimentally study the effect of supply flow rate and the gap height on the performance of deformation, vibration, and stress in the thin and fragile wafers. It is found that an optimal value exists. We then verify the merit in gripping ultrathin wafers softly with a small deformation or stress via comparison with two Bernoulli grippers and a combined gripper. The new gripper plays an important role in handling thin and fragile materials.
机译:超薄晶片(厚度<100μm厚)的处理是一个具有挑战性的任务,因为这些是最薄和最脆弱的材料之一。本文为基于分布式Bernoulli原理提供了一种用于超薄晶片的软作用和非接触式夹持技术,并提出了一种用于评估性能的实验测量方法。设计了用于超薄晶片的分布式Bernoulli夹具,通过理论分析和实验研究了夹具的特性。提出了三种性能指标,用于评估软夹持的性质:变形,振动和应力。通过测量实验,研究了由空气流量和间隙高度组成的关键操作参数对性能指标的影响。基于实验数据,获得了适当的参数设置。本发明的夹具的比较揭示了所提出的抓握技术在柔软的夹持薄和脆性材料中优异。本文提供了在薄型和脆弱的材料的实际应用中实施分布式Bernoulli原则的指导。对从业者的注意事项 - 开发新的软作用和非接触夹具的这项研究受到了抓握问题的激励像超薄晶片这样的脆弱工件。传统的接触式处理方法通常导致缺陷的产品,包括裂缝,接触污染或机械磨损,并且现有的伯尔努利夹具具有缺点,导致具有大变形作为中心负压力的影响,以及晶片在夹具上的碰撞作为锋利的提升力曲线。本文基于分布的Bernoulli原理提出了一种用于超薄晶片的软作用和非接触夹具。提供一种由建模,测量和评估组成的系统方法,用于抓握技术。我们提出了三种性能指标,用于评估软夹持的特点,并通过实验研究供给流速和间隙高度对薄薄片晶圆和脆弱晶片变形,振动和应力性能的影响。发现存在最佳值。然后,我们通过与两个Bernoulli夹持器和组合的夹具进行比较,验证用小变形或压力轻轻地夹持超薄晶片的优点。新的夹具在处理薄片和脆弱的材料方面发挥着重要作用。

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