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首页> 外文期刊>IEEE transactions on automation science and engineering >Soft-Acting, Noncontact Gripping Method for Ultrathin Wafers Using Distributed Bernoulli Principle
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Soft-Acting, Noncontact Gripping Method for Ultrathin Wafers Using Distributed Bernoulli Principle

机译:分布式伯努利原理的超薄晶片的软作用非接触式夹持方法

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The handling of ultrathin wafers (<100 mu m thickness) is a challenging task since these are among the thinnest and most fragile materials. This paper provides a soft-acting and noncontact gripping technology for ultrathin wafer based on the distributed Bernoulli principle, and also proposes an experimental measurement method for evaluating the performance. A distributed Bernoulli gripper for ultrathin wafers is designed, and the characteristics of the gripper are studied via theoretical analysis and experiments. Three performance indices for evaluating the properties of the soft gripping: deformation, vibration, and stress are presented. Through measurement experiments, the effects of the key operational parameters consisting of air flow rate and gap height on the performance indices are investigated. Based on the experimental data, the appropriate parameters settings are obtained. The comparison to present grippers reveals that the proposed gripping technology is superior in soft gripping thin and fragile materials. This paper provides guidance for implementing the distributed Bernoulli principle in practical applications of soft-acting and noncontact gripping for thin and fragile materials.Note to Practitioners-This research of developing a new soft-acting and noncontact gripper was motivated by the problem of gripping of fragile workpieces like ultrathin wafers. The traditional contact handling method often leads to defective products including cracks, contact contamination, or mechanical wears, and the existing Bernoulli gripper has the shortcoming of resulting in large deformation as the impact of center negative pressure force, and the collision of wafer onto the gripper as the sharp lifting force curve. In this paper, we propose a soft-acting and noncontact gripper for ultrathin wafer based on the distributed Bernoulli principle. A systematic approach which consists of modeling, measurement, and evaluation is provided for the gripping techniques. We present three performance indices for evaluating the characteristics of soft gripping, and experimentally study the effect of supply flow rate and the gap height on the performance of deformation, vibration, and stress in the thin and fragile wafers. It is found that an optimal value exists. We then verify the merit in gripping ultrathin wafers softly with a small deformation or stress via comparison with two Bernoulli grippers and a combined gripper. The new gripper plays an important role in handling thin and fragile materials.
机译:处理超薄晶片(厚度小于100微米)是一项艰巨的任务,因为它们是最薄,最易碎的材料之一。本文基于分布式伯努利原理,提供了一种超薄晶片的软作用和非接触式抓持技术,并提出了一种评估性能的实验方法。设计了一种用于超薄晶圆的分布式伯努利夹持器,并通过理论分析和实验研究了夹持器的特性。提出了用于评估软夹持性能的三个性能指标:变形,振动和应力。通过测量实验,研究了关键操作参数(包括空气流量和间隙高度)对性能指标的影响。根据实验数据,获得适当的参数设置。与目前的夹持器的比较表明,所提出的夹持技术在软夹持薄而易碎的材料方面具有优势。本文为在薄而易碎的材料的软作用和非接触式夹持器的实际应用中实施分布式伯努利原理提供了指导。从业者说明-本研究的开发是由于夹持问题而推动的。易碎的工件,例如超薄晶圆。传统的接触处理方法通常会导致缺陷产品,包括破裂,接触污染或机械磨损,而现有的伯努利夹持器的缺点是会受到中心负压力的影响而导致较大的变形,以及晶圆与夹持器的碰撞如急剧的提升力曲线。在本文中,我们基于分布式伯努利原理,提出了一种用于超薄晶片的软作用非接触式夹持器。为夹持技术提供了一种由建模,测量和评估组成的系统方法。我们提供了三个性能指标来评估软夹持特性,并通过实验研究了供气流量和间隙高度对薄而易碎晶片的变形,振动和应力性能的影响。发现存在最佳值。然后,通过与两个伯努利夹持器和组合夹持器进行比较,我们验证了以较小的变形或应力轻柔地夹持超薄晶片的优点。新型夹持器在处理薄而易碎的材料方面起着重要作用。

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