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Effect of coexistence of defect and dopant on the quantum capacitance of graphene-based supercapacitors electrodes

机译:缺陷和掺杂剂共存对石墨烯基超级电容器电极量子电容的影响

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摘要

The influence of doping (B, N, Al, Si, P, S), vacancy, and Stone-Wales defect on stability, electronic structures, quantum capacitance, and surface charge storage of graphene is explored by density functional theory calculations. The results indicate that the quantum capacitance and surface charge storage can be significantly improved by the introducing of defect and doping. Furthermore, the enhancement of doped vacancy-defected graphene is more obvious than that of doped Stone-Wales defected graphene. By analyzing the density of states, it can be obtained that the improvement of quantum capacitance is resulted from the presence of localized states around Fermi level by doping or defect. Moreover, the effect of concentration of doping and defect on the graphene is also explored, and the results suggest that the quantum capacitance increases with the increasing of concentration for most modified graphene-based substrates. The findings can provide effective approach for improving the performance of graphene-based surpercapacitors.
机译:通过密度泛函理论计算,研究了掺杂(B,N,Al,Si,P,S),空位和Stone-Wales缺陷对石墨烯的稳定性,电子结构,量子电容和表面电荷存储的影响。结果表明,通过引入缺陷和掺杂可以显着改善量子电容和表面电荷存储。此外,掺杂的空位偏转石墨烯的增强比掺杂的Stone-Wales缺陷石墨烯的增强更明显。通过分析状态的密度,可以得出量子电容的改善是由于掺杂或缺陷引起的费米能级附近的局部状态的存在。此外,还探讨了掺杂浓度和缺陷浓度对石墨烯的影响,结果表明,大多数改性石墨烯基衬底的量子电容随浓度的增加而增加。这些发现可以为改善基于石墨烯的超级电容器的性能提供有效的方法。

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