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Analysis of the morphology, structure and optical properties of 1D SiO_2 nanostructures obtained with sol-gel and electrospinning methods

机译:溶胶-凝胶法和静电纺丝法制备一维SiO_2纳米结构的形貌,结构和光学性质

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The aim of the study was the production of ceramic SiO2 nanowires using the sol-gel and electrospinning methods from a PVP/TEOS/AcOH/EtOH solution. The obtained fibrous mats underwent preliminary drying at room temperature. Then, they were subjected to the calcination process in air to obtain pure amorphous silicon dioxide nanowires. A scanning electron microscope (SEM) with an energy dispersive spectrometer (EDS) was used in order to carry out an analysis of the morphology and chemical composition of the resulting nanowires. A high-resolution transmission electron microscope (TEM) was used along with X-ray diffraction analysis (XRD) in order to analyse the structure of the obtained materials. Besides, thermogravimetric analysis (TGA) was performed to show polymer concentration loss in the function of temperature in the obtained two types of PVP/SiO2 nanofibers. The analysis of the optical properties and the energy band gap of the prepared nanowires was determined by spectral analysis using a UV-Vis spectrophotometer. Using the method proposed by the authors and the recorded absorbance spectra determined the banded refractive index n, real n' and imaginary k part of the refractive index as a function of the wavelength, complex dielectric constant epsilon, real and imaginary part er and epsilon(i) of the dielectric constant as a function of the wavelength of the SiO2 nanowires. The obtained results, which were as follows: energy band gap of 3.93-3.97 eV, complex refractive index coefficient values of 1.52-1.65 and dielectric constant in the range of 2.30-2.73, suggest the possibility to control the morphology and optical properties of the produced nanomaterial.
机译:该研究的目的是使用溶胶-凝胶和电纺丝方法从PVP / TEOS / AcOH / EtOH溶液生产陶瓷SiO2纳米线。将获得的纤维垫在室温下进行初步干燥。然后,将它们在空气中进行煅烧处理,以获得纯的无定形二氧化硅纳米线。为了对所得纳米线的形态和化学组成进行分析,使用了带有能量色散光谱仪(EDS)的扫描电子显微镜(SEM)。为了分析所得材料的结构,使用了高分辨率透射电子显微镜(TEM)和X射线衍射分析(XRD)。此外,进行了热重分析(TGA),以显示所得两种PVP / SiO2纳米纤维中聚合物的浓度损失随温度的变化。通过使用UV-Vis分光光度计的光谱分析来确定所制备的纳米线的光学性质和能带隙的分析。使用作者提出的方法并记录吸收光谱,确定折射率的带状折射率n,实数n'和虚数k部分与波长,复介电常数ε,实虚数部分er和epsilon( i)介电常数随SiO2纳米线波长的变化而变化。获得的结果如下:能带隙为3.93-3.97 eV,复折射率系数值为1.52-1.65,介电常数在2.30-2.73范围内,这表明有可能控制其形态和光学性质。生产的纳米材料。

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