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首页> 外文期刊>Applied Surface Science >Analysis of the morphology, structure and optical properties of 1D SiO_2 nanostructures obtained with sol-gel and electrospinning methods
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Analysis of the morphology, structure and optical properties of 1D SiO_2 nanostructures obtained with sol-gel and electrospinning methods

机译:用溶胶 - 凝胶和静电纺丝方法获得1D SiO_2纳米结构的形态,结构和光学性能的分析

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The aim of the study was the production of ceramic SiO2 nanowires using the sol-gel and electrospinning methods from a PVP/TEOS/AcOH/EtOH solution. The obtained fibrous mats underwent preliminary drying at room temperature. Then, they were subjected to the calcination process in air to obtain pure amorphous silicon dioxide nanowires. A scanning electron microscope (SEM) with an energy dispersive spectrometer (EDS) was used in order to carry out an analysis of the morphology and chemical composition of the resulting nanowires. A high-resolution transmission electron microscope (TEM) was used along with X-ray diffraction analysis (XRD) in order to analyse the structure of the obtained materials. Besides, thermogravimetric analysis (TGA) was performed to show polymer concentration loss in the function of temperature in the obtained two types of PVP/SiO2 nanofibers. The analysis of the optical properties and the energy band gap of the prepared nanowires was determined by spectral analysis using a UV-Vis spectrophotometer. Using the method proposed by the authors and the recorded absorbance spectra determined the banded refractive index n, real n' and imaginary k part of the refractive index as a function of the wavelength, complex dielectric constant epsilon, real and imaginary part er and epsilon(i) of the dielectric constant as a function of the wavelength of the SiO2 nanowires. The obtained results, which were as follows: energy band gap of 3.93-3.97 eV, complex refractive index coefficient values of 1.52-1.65 and dielectric constant in the range of 2.30-2.73, suggest the possibility to control the morphology and optical properties of the produced nanomaterial.
机译:该研究的目的是使用PVP / TEOS / ACOH / ETOH溶液中的溶胶 - 凝胶和静电纺丝方法生产陶瓷SiO2纳米线。所得纤维垫在室温下进行初步干燥。然后,将它们进行空气中的煅烧过程,以获得纯无定形二氧化硅纳米线。使用具有能量分散光谱仪(EDS)的扫描电子显微镜(SEM)以进行所得纳米线的形态和化学组成的分析。高分辨率透射电子显微镜(TEM)与X射线衍射分析(XRD)一起使用,以分析所得材料的结构。此外,进行热重分析(TGA)以在所获得的两种类型的PVP / SiO 2纳米纤维中显示温度函数中的聚合物浓度损失。通过使用UV-Vis分光光度计通过光谱分析测定制备纳米线的光学性质和能带隙的分析。使用作者提出的方法和记录的吸光度光谱确定作为波长,复合介电常数ε,真实和虚部ER和EPSILON的函数的折射率的带状折射率n,实体n'和假想k部分( i)介电常数作为SiO2纳米线的波长的函数。得到的结果如下:电能带隙为3.93-3.97eV,复杂折射率系数值为1.52-1.65,介电常数在2.30-2.73的范围内,表明可以控制形态和光学性质的可能性生产的纳米材料。

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