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Structural, morphological and optical properties of Nickel-doped SnO2 nanostructure materials prepared by the sol-gel method under different heat treatments

机译:溶胶-凝胶法在不同热处理条件下制备的掺镍SnO2纳米结构材料的结构,形貌和光学性质

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This work presents a detailed study of the influence of different annealing temperatures on the structural, morphological and optical properties 5 wt% Ni doped SnO2 thin films. Ni doped SnO2 thin films were deposited by sol gel method on glass substrates and then annealed at different temperature. Structural and morphological investigations were carried out on all samples by X-ray diffraction method and atomic force microscopy while Optical properties were obtained with UV-Visible spectrophotometer. Structural analysis showed that all films are polycrystalline with rutile phase and preferred orientation (110) which improves with increasing the annealing temperature. The grain size is calculated by the Scherrer method ranges from 3.9 nm to 9.13 nm AFM images showed that Ni doped SnO2 thin films have a smooth surface morphology with nanostructure surface roughness in the range of 12 to 25 nm. The optical properties in the visible range showed that the deposited layers have a high transmission factor. An average transmittance of >75% was observed for all the films. The optical band gap energy vary in the range of 3.89-4.02 eV with the increase in annealing temperature.
机译:这项工作提出了对不同退火温度对5 wt%Ni掺杂SnO2薄膜的结构,形态和光学性能的影响的详细研究。镍掺杂的SnO2薄膜通过溶胶凝胶法沉积在玻璃基板上,然后在不同温度下退火。通过X射线衍射法和原子力显微镜对所有样品进行了结构和形态研究,同时使用紫外可见分光光度计获得了光学性质。结构分析表明,所有薄膜均为金红石相且具有较好的取向(110)的多晶,随着退火温度的升高,取向会改善。通过Scherrer方法计算的晶粒尺寸在3.9nm至9.13nm的范围内。AFM图像显示,掺Ni的SnO 2薄膜具有光滑的表面形态,纳米结构的表面粗糙度在12至25nm的范围内。在可见光范围内的光学性能表明,沉积的层具有高的透射系数。所有膜的平均透射率均> 75%。随着退火温度的升高,光学带隙能量在3.89-4.02 eV的范围内变化。

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