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Structural, morphological and optical properties of Nickel-doped SnO2 nanostructure materials prepared by the sol-gel method under different heat treatments

机译:镍掺杂的SnO2纳米结构材料的结构,形态学和光学性质在不同热处理下制备的溶胶 - 凝胶法制备

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This work presents a detailed study of the influence of different annealing temperatures on the structural, morphological and optical properties 5 wt% Ni doped SnO2 thin films. Ni doped SnO2 thin films were deposited by sol gel method on glass substrates and then annealed at different temperature. Structural and morphological investigations were carried out on all samples by X-ray diffraction method and atomic force microscopy while Optical properties were obtained with UV-Visible spectrophotometer. Structural analysis showed that all films are polycrystalline with rutile phase and preferred orientation (110) which improves with increasing the annealing temperature. The grain size is calculated by the Scherrer method ranges from 3.9 nm to 9.13 nm AFM images showed that Ni doped SnO2 thin films have a smooth surface morphology with nanostructure surface roughness in the range of 12 to 25 nm. The optical properties in the visible range showed that the deposited layers have a high transmission factor. An average transmittance of >75% was observed for all the films. The optical band gap energy vary in the range of 3.89-4.02 eV with the increase in annealing temperature.
机译:该工作提出了对不同退火温度对结构,形态学和光学性质5wt%Ni掺杂的SnO2薄膜的影响的详细研究。通过溶胶凝胶法在玻璃基板上沉积Ni掺杂的SnO2薄膜,然后在不同温度下退火。通过X射线衍射方法和原子力显微镜对所有样品进行结构和形态研究,而用UV可见分光光度计获得光学性质。结构分析表明,所有薄膜都具有金红石相和优选的取向(110),其随着增加的退火温度而改善。通过Scherrer方法计算的晶粒尺寸为3.9nm至9.13nm的AFM图像显示Ni掺杂的SnO2薄膜具有光滑的表面形态,纳米结构表面粗糙度在12至25nm的范围内。可见范围中的光学性质显示沉积层具有高透射系数。为所有薄膜观察到> 75%的平均透射率。光学带隙能量在3.89-4.02eV的范围内随着退火温度的增加而变化。

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