Friction measurements using force versus distance friction loops in force microscopy

摘要

The atomic force microscope (AFM) allows investigation of the properties of surfaces and interfaces at atomic scale resolution. However, several different operational modes (imaging, force versus distance and lateral force), need to be deployed in order to gain insight into the structure, tribiological and mechanical properties. A new method, based on a variation of the force versus distance mode, has been developed. In essence, a coupling of the deformational modes of the probe is exploited whereby the tip is induced to undergo lateral travel in response to application of an out-of-plane force (and thus normal bending of the force-sensing lever). The lateral travel induces in-plane forces that are then measurable as a consequence of stimulation of the 'buckling' deformational mode of the lever. Outcomes will be demonstrated for atomically flat surfaces of WTe2 and highly oriented pyrolytic graphite. (C) 2004 Elsevier B.V. All rights reserved.