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首页> 外文期刊>Applied Surface Science >Luminescent properties of SrGa2S4 : Eu thin film phosphors deposited by two electron beam evaporation
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Luminescent properties of SrGa2S4 : Eu thin film phosphors deposited by two electron beam evaporation

机译:两次电子束蒸发沉积SrGa2S4:Eu薄膜荧光粉的发光特性。

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SrGa2S4:Eu thin film phosphors have been deposited on quartz glass substrates at substrate temperatures of 350-450 degrees C by multi-source deposition method in which two electron beam (2EB) evaporation sources were used. The films were annealed between 750 and 850 degrees C for 30 min in H2S atmosphere after the deposition. It was shown by XRD measurement that SrGa2S4 phase was not formed but crystalline GaS was included in an as-deposited film, therefore, PL and CL due to SrGa2S4:Eu were not observed. The SrGa2S4 phase was formed by the annealing. Photoluminescence (PL) and cathodoluminescence (CL) spectra of all annealed films showed green emission peaked at about 530 nm. CL luminance of all the films increased as the substrate temperature was increased. But the dependence on annealing temperature was not observed. So CL luminance depended only on substrate temperature during deposition. However, the CL luminance did not depend clearly on the annealing temperature between 750 and 850 degrees C. The SrGa2S4:Eu film deposited at 450 degrees C and annealed at 850 degrees C for 30 min showed a CL luminance and CIE coordinates of 1700 cd/m(2) and (0.27, 0.67), respectively under excitation with 3 kV and 60 mu A/cm(2). (c) 2004 Elsevier B.V. All rights reserved.
机译:通过使用两个电子束(2EB)蒸发源的多源沉积法,在350-450摄氏度的衬底温度下,在石英玻璃衬底上沉积了SrGa2S4:Eu薄膜荧光粉。沉积后,将膜在H2S气氛中于750至850摄氏度之间退火30分钟。通过XRD测量显示未形成SrGa 2 S 4相,但是在沉积的膜中包括结晶GaS,因此未观察到由于SrGa 2 S 4:Eu引起的PL和CL。通过退火形成SrGa 2 S 4相。所有退火膜的光致发光(PL)和阴极发光(CL)光谱显示绿色发射在约530 nm达到峰值。随着基板温度的升高,所有膜的CL亮度都升高。但是未观察到对退火温度的依赖性。因此,CL亮度仅取决于沉积过程中的基板温度。但是,CL亮度并不明显取决于750至850摄氏度之间的退火温度。在450摄氏度下沉积并在850摄氏度下退火30分钟的SrGa2S4:Eu膜显示出CL亮度,CIE坐标为1700 cd / m(2)和(0.27,0.67),分别在3 kV和60μA / cm(2)的激励下。 (c)2004 Elsevier B.V.保留所有权利。

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