Y_2O_3:Eu~(3+) luminescent thin film deposited on quartz fiber by electron beam evaporation technology

摘要

Y_2O_3:Eu~(3+) luminescent thin films were deposited on quartz fiber substrates using electron beam evaporation technology and then annealed at different temperatures and times. Influences of annealing conditions on surface morphology, structural properties and luminescent properties of the deposited films were studied. The interaction between annealing temperature and time on the microstructure and luminescent intensity of the films was also investigated. Experimental results indicated that the effect of the annealing conditions on the surface morphology of the films was obvious when the films annealed at a high temperature of 1000 ℃ for 2 or 3 h. Improving crystallization and growing average crystallite size of the films were observed as a result of the increasing annealing temperature and time. The luminescent properties results indicated that the crystalline properties are the important dominant factor affected the luminescent properties of the deposited films and the effective luminescence was detected when the film annealed at 1000 ℃ for 3 h.