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Study of Be δ-doped GaAs/AlAs multiple quantum wells by the surface photovoltage spectroscopy

机译:表面光电压谱研究Beδ掺杂GaAs / AlAs多量子阱

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We report a surface photovoltage and differential surface photovoltage (DSPV) study of Be δ-doped GaAs/AlAs multiple quantum wells (QWs) with widths ranging from 3 to 20 nm and sheet doping densities from 2 x 10~(10) to 2.5 x 10~(12) cm~(-2) per well aiming to characterize their electronic properties and structural quality. From a line shape analysis of room temperature DSPV spectra the interband excitonic transition energies and broadening parameters for a large number of QW-related subbands have been established. A study of well-width and quantum number dependencies of the excitonic linewidths allowed us to evaluate the various broadening contributions to the spectral line shapes in QWs of different design. It was found that an average half monolayer well-width fluctuations are the dominant broadening mechanism of the excitonic line for QWs thinner than 10 nm. In QWs thicker than 10 nm, the spectral line broadening originates mainly from thermal broadening as well as Stark broadening due to random electric fields of ionized impurities and exciton scattering by free holes.
机译:我们报告了Beδ掺杂的GaAs / AlAs多量子阱(QWs)的表面光电压和差分表面光电压(DSPV)研究,量子阱的宽度为3至20 nm,片掺杂密度为2 x 10〜(10)至2.5 x每孔10〜(12)cm〜(-2),以表征其电子性能和结构质量。通过对室温DSPV谱的线形分析,已经建立了许多QW相关子带的带间激子跃迁能和展宽参数。对激子线宽的阱宽和量子数依赖性的研究使我们能够评估不同设计的量子阱中谱线形状的各种加宽贡献。已经发现,对于小于10nm的QW,平均半个单层阱宽波动是激子线的主要展宽机理。在厚于10 nm的QW中,由于电离杂质的随机电场和自由孔的激子散射,光谱线展宽主要来自热展宽和Stark展宽。

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