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Stress Relief Patterns Of Hydrogenated Amorphous Carbon Films Grown By Dc-pulse Plasma Chemical Vapor Deposition

机译:Dc脉冲等离子体化学气相沉积法生长的氢化非晶碳膜的应力释放模式

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Hydrogenated amorphous carbon films were prepared on Si (1 0 0) substrates by dc-pulse plasma chemical vapor deposition. The nature of the deposited films was characterized by Raman spectra and the stress relief patterns were observed by scanning electron microscope. Besides the well-known sinusoidal type and flower type patterns, etc., two different stress relief patterns, ring type and peg-top shape with exiguous tine on the top, were observed. The ring type in this paper was a clear ridge-cracked buckle and unusual. Two competing buckle delamination morphologies ring and sinusoidal buckling coexist. The ridge-cracked buckle in ring type was narrower than the sinusoidal buckling. Meanwhile peg-top shape with exiguous tine on the top in this paper was unusual. These different patterns supported the approach in which the stress relief forms have been analyzed using the theory of plate buckling.
机译:通过直流脉冲等离子体化学气相沉积法在Si(1 0 0)衬底上制备了氢化非晶碳膜。用拉曼光谱表征沉积膜的性质,并通过扫描电子显微镜观察应力释放图案。除了众所周知的正弦曲线型和花朵型等,还观察到了两种不同的应力释放模式,即环形和钉形,顶部带有尖齿。本文的戒指类型是清晰的山脊裂纹的带扣,不寻常。两种相互竞争的扣环分层形态环和正弦屈曲共存。环形的脊状裂纹扣比正弦形屈曲窄。同时,本文顶部带有尖齿的钉顶形状是不寻常的。这些不同的模式支持使用板屈曲理论分析应力释放形式的方法。

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