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Electronic characteristics of p-type transparent SnO high carrier mobility monolayer with high carrier mobility

机译:具有高载流子迁移率的p型透明SnO高载流子迁移率单层的电子特性

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摘要

More recently, two-dimensional (2D) SnO nanosheets are attaching great attention due to its excellent carrier mobility and transparent characteristics. Here, the stability, electronic structures and carrier mobility of SnO monolayer are investigated by using first-principles calculations. The calculations of the phonon dispersion spectra indicate that SnO monolayer is dynamically stable. Moreover, the band gap values are decreased from 3.93 eV to 2.75 eV when the tensile strain is applied from 0% to 12%. Interestingly, SnO monolayer is a p-type transparent semiconducting oxide with hole mobility of 641 cm(2) V-1 s(-1), which is much higher than that of MoS2 monolayer. These findings make SnO monolayer becomes a promising 2D material for applications in nanoelectronic devices. (C) 2017 Elsevier B.V. All rights reserved.
机译:最近,二维(2D)SnO纳米片由于其出色的载流子迁移率和透明性而备受关注。在这里,使用第一性原理计算来研究SnO单层的稳定性,电子结构和载流子迁移率。声子色散谱的计算表明,SnO单层是动态稳定的。而且,当将拉伸应变从0%施加到12%时,带隙值从3.93eV减小到2.75eV。有趣的是,SnO单层是p型透明半导体氧化物,空穴迁移率为641 cm(2)V-1 s(-1),远高于MoS2单层。这些发现使SnO单层成为在纳米电子器件中应用的有前途的2D材料。 (C)2017 Elsevier B.V.保留所有权利。

著录项

  • 来源
    《Applied Surface Science》 |2017年第15期|114-119|共6页
  • 作者单位

    Henan Normal Univ, Coll Phys & Mat Sci, Xinxiang 453007, Henan, Peoples R China;

    Henan Normal Univ, Coll Phys & Mat Sci, Xinxiang 453007, Henan, Peoples R China;

    Henan Inst Sci & Technol, Xinxiang 453003, Peoples R China;

    Henan Normal Univ, Coll Phys & Mat Sci, Xinxiang 453007, Henan, Peoples R China;

    Univ Texas Arlington, Dept Phys, POB 19059, Arlington, TX 76019 USA;

    Henan Normal Univ, Coll Phys & Mat Sci, Xinxiang 453007, Henan, Peoples R China;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    SnO; Monolayer; p-type; Carrier mobility;

    机译:SnO单层p型载流子迁移率;

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