首页> 外文期刊>IEEE Transactions on Applied Superconductivity >Pinning effect on critical dynamics inTl2Ba2CaCu2O8 films beforeand after introducing columnar defects
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Pinning effect on critical dynamics inTl2Ba2CaCu2O8 films beforeand after introducing columnar defects

机译:引入柱状缺陷前后钉扎对Tl2Ba2CaCu2O8薄膜临界动力学的影响

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The effect of columnar defects on the critical dynamics of superconducting Tl2Ba2CaCu2O8 (Tl-2212) film has been investigated. The Tl-2212 film was irradiated at 0°C by 1.3 GeV U-ions along the normal of the film surface. The dose of 6.0×1010 ions/cm2 of the U-ion irradiation corresponds to a matching field of 1.2 T. The in-plane longitudinal resistivity of the irradiated Tl-2212 has been measured as a function of magnetic field H and temperature T. The extracted fluctuation part of the conductivity σxx(T, H) of the unirradiated sample exhibits 3D-XY scaling behavior that reveals dynamic critical exponent z=1.8±0.1 and static critical exponent ν≈1.338. The results indicate that the weak interlayer coupling along the c-axis of Tl-2212 significantly influences static critical exponent ν and does not change dynamical critical exponent. After the irradiation, the fluctuation conductivities are enhanced by the strong pinnings and do not exhibit the same 3D-XY scaling behavior as for the unirradiated Tl-2212. Particularly at the low magnetic field values near the matching field of 1.2 T, the fluctuation conductivities show a clear deviation from the critical dynamics, suggesting that the pinning effect on the critical dynamics is significant
机译:研究了柱状缺陷对超导Tl2Ba2CaCu2O8(Tl-2212)薄膜临界动力学的影响。沿膜表面的法线在0℃下用1.3 GeV U-离子辐照Tl-2212膜。 U离子辐照的剂量为6.0×1010离子/ cm2对应于1.2 T的匹配场。已测量被辐照的Tl-2212的面内纵向电阻率是磁场H和温度T的函数。未辐照样品的电导率σxx(T,H)的提取波动部分表现出3D-XY缩放行为,揭示了动态临界指数z = 1.8±0.1和静态临界指数ν≈ 1.338。结果表明,沿着Tl-2212的c轴的薄层间耦合会显着影响静态临界指数ν,而不会更改动态临界指数。照射后,波动电导率通过强固定作用增强,并且不表现出与未照射Tl-2212相同的3D-XY缩放行为。特别是在接近1.2 T匹配场的低磁场值下,波动电导率显示出与临界动力学的明显偏差,这表明对临界动力学的钉扎效应非常明显

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