首页> 外文期刊>Applied Physics Letters >Uncooled bolometer based on Mn1.56Co0.96Ni0.48O4 thin films for infrared detection and thermal imaging
【24h】

Uncooled bolometer based on Mn1.56Co0.96Ni0.48O4 thin films for infrared detection and thermal imaging

机译:基于Mn 1.56 Co 0.96 Ni 0.48 O 4 薄膜的非冷却辐射热计用于红外检测和热成像

获取原文
获取原文并翻译 | 示例
           

摘要

Polycrystalline films of Mn1.56Co0.96Ni0.48O4 (MCN) were evaluated for uncooled bolometric applications grown by chemical solution deposition on amorphous Al2O3 substrate. The microstructural characterizations showed that the films were of excellent crystallization and compact surface morphology. Electrical results showed that the temperature coefficient of resistance reached −3.8%/K at 295 K. Low excess noise (normalized Hooge parameter αH of 7.6 × 10−28 m3) was achieved owing to the good epitaxial quality of the prepared films. Infrared bolometers were fabricated to evaluate the performance on infrared detection. It exhibited a noise equivalent temperature as low as 2.1 × 10−7 K/Hz1/2, responsivity of 330 V/W, detectivity of 0.6 × 108 cm Hz1/2/W, and noise equivalent power of 3.7 × 10−10 W/Hz1/2 at 30 Hz. The feasibility of the MCN films was demonstrated to be used for uncooled bolometric applications by thermal imaging. One can expect to get a responsivity of about 1 × 103 V/W and detectivity higher than 6 × 108 cm Hz1/2/W at 30 Hz for thermally isolated MCN film bolometer. The results of MCN showed its great potentiality for future room-temperature detection.
机译:评估了Mn 1.56 Co 0.96 Ni 0.48 O 4 (MCN)的多晶膜的非冷却辐射热分析应用化学溶液沉积在非晶Al 2 O 3 衬底上。显微组织表征表明,该膜具有优异的结晶性和致密的表面形态。电学结果表明,电阻的温度系数在295 resistanceK时达到-3.8%/ K。较低的多余噪声(归一化的Hooge参数α H / n为7.6×10 -28 m 3 )的获得是由于所制备的薄膜具有良好的外延质量。制作了红外辐射热计,以评估红外检测的性能。噪声等效温度低至2.1×10 −7 K / Hz 1/2 ,响应度为330 V / W,探测度为0.6×10 8 cm Hz 1/2 / W,噪声等效功率3.7×10 −10 W / Hz 1/2 在30 Hz。 MCN膜的可行性已通过热成像证明可用于非冷却辐射热分析应用。可以期望得到大约1×10 3 V / W的响应度,并且探测灵敏度高于6×10 8 cm Hz 1/2 / W在30 Hz下用于热绝缘MCN膜辐射热计。 MCN的结果显示了其在未来室温检测中的巨大潜力。

著录项

  • 来源
    《Applied Physics Letters》 |2014年第2期|1-5|共5页
  • 作者单位

    National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号