首页> 外文期刊>Applied Physics Letters >Secondary ion mass spectrometric studies of SrTiO_3 buffering effect on (Pb_(1-x)La_x)(Zr_(1-y)Ti_y)_(1-x/4)O_3 thin films prepared by pulsed laser deposition
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Secondary ion mass spectrometric studies of SrTiO_3 buffering effect on (Pb_(1-x)La_x)(Zr_(1-y)Ti_y)_(1-x/4)O_3 thin films prepared by pulsed laser deposition

机译:二次离子质谱研究通过脉冲激光沉积制备的SrTiO_3对(Pb_(1-x)La_x)(Zr_(1-y)Ti_y)_(1-x / 4)O_3薄膜的缓冲作用

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摘要

Thin films of (Pb_(1-x)La_x)(Zr_(1-y)Ti_y)_(1-x/4)O_3 (5/70/30) were deposited in situ onto (100) Si, Pt/Ti/SiO_2/Si, and SrTiO_3/Si substrates by pulsed laser deposition from stoichiometric targets and subsequent annealing. Films grown on SrTiO_3/Si exhibited desired perovskite structure. On (100) Si and Pt/Ti/SiO_2/Si substrates, films exhibited a perovskite-pyrochlore mixed structure. Apparent Pb deficiency at the near-surface region was observed. Films deposited at different substrates showed variations in Si content. The buffering effect of SrTiO_3 was evidenced using x-ray diffraction and secondary ion mass spectrometry analyses.
机译:(Pb_(1-x)La_x)(Zr_(1-y)Ti_y)_(1-x / 4)O_3(5/70/30)的薄膜原位沉积在(100)Si,Pt / Ti上/ SiO_2 / Si和SrTiO_3 / Si衬底通过化学计量靶的脉冲激光沉积和随后的退火处理。在SrTiO_3 / Si上生长的薄膜表现出所需的钙钛矿结构。在(100)Si和Pt / Ti / SiO_2 / Si衬底上,膜表现出钙钛矿-烧绿石混合结构。在近表面区域观察到明显的铅缺乏。沉积在不同基板上的膜显示出Si含量的变化。 X射线衍射和二次离子质谱分析证明了SrTiO_3的缓冲作用。

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