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Ferroelectric size effects in multiferroic BiFeO_3 thin films

机译:多铁性BiFeO_3薄膜的铁电尺寸效应

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摘要

Ferroelectric size effects in multiferroic BiFeO_3 have been studied using a host of complementary measurements. The structure of such epitaxial films has been investigated using atomic force microscopy, transmission electron microscopy, and x-ray diffraction. The crystal structure of the films has been identified as a monoclinic phase, which suggests that the polarization direction is close to (111). Such behavior has also been confirmed by piezoforce microscopy measurements. That also reveals that the ferroelectricity is down to at least 2 nm.
机译:使用大量补充测量方法研究了多铁性BiFeO_3中的铁电尺寸效应。已经使用原子力显微镜,透射电子显微镜和x射线衍射研究了这种外延膜的结构。膜的晶体结构已被鉴定为单斜晶相,这表明偏振方向接近(111)。压电显微镜测量也证实了这种行为。这也揭示了铁电性降低至至少2nm。

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