首页> 外国专利> MANUFACTURING FERROELECTRIC FILM AND FERROELECTRIC THIN FILM ELEMENTS, FERROELECTRIC THIN FILM STRUCTURE AND FERROELECTRIC THIN FILM ELEMENT

MANUFACTURING FERROELECTRIC FILM AND FERROELECTRIC THIN FILM ELEMENTS, FERROELECTRIC THIN FILM STRUCTURE AND FERROELECTRIC THIN FILM ELEMENT

机译:制造铁电薄膜和铁电薄膜元件,铁电薄膜结构和铁电薄膜元件

摘要

PROBLEM TO BE SOLVED: To easily epitaxially grow a ferroelectric thin film, by forming a TiN with Ti partly substituted by Al as a conductive film, forming a (Ba, Sr)TiO3 base layer on the TiN film, and depositing a Pb type Perovskite oxide ferroelectric on the base layer. ;SOLUTION: A manufacturing method comprises, steps of forming a TiN film where part of a Ti site is substituted by Al 10% as converted in Al atom by the pulse laser vapor deposition at a pressure of about 10-5 Torr, substrate temp. of 550-650°C, laser repetition frequency of 5 Hz and laser energy density of 4.5 J/cm2(KrF), growing on the TiN film a (Ba, Sr)TiO3 thin base film by the pulse laser vapor deposition at a pressure of about 10-4 Torr, substrate temp. of 550°C, laser repetition frequency of 5 Hz and laser energy density of 5.0 J/cm2(KrF), and forming a Pb type Perovskite oxide ferroelectric thereon.;COPYRIGHT: (C)1999,JPO
机译:解决的问题:为了容易地外延生长铁电薄膜,通过形成一部分被Al取代的Ti作为导电膜形成TiN,在TiN上形成(Ba,Sr)TiO 3 基层膜,并在基层上沉积Pb型钙钛矿氧化物铁电体。 ;解决方案:一种制造方法包括以下步骤:形成TiN膜,在该膜中,Ti部位的一部分被10%Sup-5压力下的脉冲激光气相沉积法转化为Al原子的10%Al取代。 Sup>托,基材温度。在TiN薄膜a(Ba,Sr)TiO 3上生长的550-650°C温度,5 Hz的激光重复频率和4.5 J / cm 2 (KrF)的激光能量密度通过脉冲激光气相沉积法在约10 -4 Torr(衬底温度)的压力下沉积薄膜。 550°C,激光重复频率5 Hz,激光能量密度5.0 J / cm 2 (KrF),并在其上形成Pb型钙钛矿氧化物铁电体。COPYRIGHT:(C)1999,日本特许厅

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