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Epitaxial Growth Of Gan Films Grown On Single Crystal Fe Substrates

机译:单晶铁基衬底上生长的Gan膜的外延生长

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GaN films have been grown on single crystalline Fe(110), Fe(100), and Fe(111) substrates with low-temperature AlN buffer layers by the use of pulsed laser deposition. AlN films with 30° rotated domains and polycrystalline AlN films grow on Fe(100) and Fe(111), respectively. On the other hand, AlN(0001) films grow epitaxially on Fe(110) substrates. X-ray reflectivity measurements have revealed that the heterointerface of AlN/Fe(110) is quite abrupt and that its abruptness remains unchanged, even after annealing at 700 ℃. GaN epitaxial films have been grown on AlN/Fe(110) structures with an in-plane relationship of GaN[11-20]‖AlN[11-20]‖Fe[001]. The first-principles calculations have revealed that this in-plane epitaxial relationship is determined by the adsorption process of nitrogen atoms on the Fe surfaces at the initial stage of the growth.
机译:GaN薄膜已通过使用脉冲激光沉积法在具有低温AlN缓冲层的单晶Fe(110),Fe(100)和Fe(111)衬底上生长。具有30°旋转畴的AlN膜和多晶AlN膜分别在Fe(100)和Fe(111)上生长。另一方面,AlN(0001)薄膜在Fe(110)衬底上外延生长。 X射线反射率测量表明,AlN / Fe(110)的异质界面非常陡峭,即使在700℃退火后,其陡度也保持不变。 GaN外延膜已经在具有GaN [11-20]” AlN [11-20]” Fe [001]的面内关系的AlN / Fe(110)结构上生长。第一性原理计算表明,这种面内外延关系是由生长初期的Fe表面上氮原子的吸附过程决定的。

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