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Polarization offsets of compositionally graded Nd-substituted Bi_4Ti_3O_(12) ferroelectric thin films

机译:组成梯度的Nd取代Bi_4Ti_3O_(12)铁电薄膜的极化偏移

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摘要

The vertical offsets of hysteresis loops of compositionally graded Nd-substituted Bi_4Ti_3O_(12) (BNdT) ferroelectric films were studied as functions of the Nd gradient, the temperature, and the amplitude of driving voltage. We show that graded BNdT films may exhibit no offsets at room temperature and both graded and nongraded BNdT films exhibit pronounced offsets at elevated temperatures. The offset does not have a direct relation with the composition gradient but increases as the maximum voltage is increased. It is verified that the offset increases with the increase in asymmetry of leakage currents at positive and negative biases.
机译:研究了组成渐变的Nd取代的Bi_4Ti_3O_(12)(BNdT)铁电薄膜的磁滞回线的垂直偏移量与Nd梯度,温度和驱动电压幅度的关系。我们表明,梯度BNdT膜在室温下可能没有偏移,而梯度和非梯度BNdT膜在高温下都显示出明显的偏移。失调与成分梯度没有直接关系,但是会随着最大电压的增加而增加。可以证明,随着正负偏压下漏电流不对称性的增加,失调也随之增加。

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