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Defeating the trade-off between process complexity and electrical performance with vertical zinc oxide transistors

机译:使用垂直氧化锌晶体管克服工艺复杂性和电气性能之间的折衷

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摘要

Short-channel devices can show high performance, but typically have difficult processing and alignment steps. We show here a simple low-temperature process to produce sub-micrometer-channel zinc-oxide thin-film transistors. The thickness of the gate metal defines the channel length, while a combination of conformal and non-conformal depositions create the channel and electrodes. Layer-to-layer alignment is noncritical. With mobility values ten times greater than amorphous silicon, high on/off current ratios at low voltage, good yield, and good thermal sinking in operation, these vertical transistors unite the performance of metal oxide semiconductors with the advantages of short-channel devices.
机译:短通道设备可以显示高性能,但通常具有困难的处理和对齐步骤。我们在这里展示了一种简单的低温工艺,以生产亚微米通道的氧化锌薄膜晶体管。栅极金属的厚度决定了沟道的长度,而保形和非保形沉积的结合形成了沟道和电极。层与层之间的对齐并不重要。这些垂直晶体管的迁移率值是非晶硅的十倍,在低电压下具有高的开/关电流比,良好的良率和良好的散热性能,这些优点将金属氧化物半导体的性能与短沟道器件的优势结合在一起。

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  • 来源
    《Applied Physics Letters》 |2012年第18期|183503.1-183503.4|共4页
  • 作者单位

    Kodak Technology Center, Eastman Kodak Company, 1999 Lake Avenue, Rochester, New York 14650, USA;

    Natcore Technology, 87 Maple Avenue, Red Bank, New Jersey 07701, USA;

    Kodak Technology Center, Eastman Kodak Company, 1999 Lake Avenue, Rochester, New York 14650, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

  • 入库时间 2022-08-18 03:17:39

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