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Low-noise epitaxial graphene on SiC Hall effect element for commercial applications

机译:SiC霍尔效应元件上的低噪声外延石墨烯,用于商业应用

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摘要

In this report, we demonstrate a complete Hall effect element that is based on quasi-free-standing monolayer graphene synthesized on a semi-insulating on-axis Si-terminated 6H-SiC substrate in an epitaxial Chemical Vapor Deposition process. The device offers the current-mode sensitivity of 87 V/AT and low excess noise (Hooge's parameter α_H<2 × 10~(-3)) enabling room-temperature magnetic resolution of 650 nT/Hz~(0.5) at 10 Hz, 95 nT/Hz~(0.5) at 1 kHz, and 14 nT/Hz~(0.5) at 100 kHz at the total active area of 0.1275 mm~2. The element is passivated with a silicone encapsulant to ensure its electrical stability and environmental resistance. Its processing cycle is suitable for large-scale commercial production and it is available in large quantities through a single growth run on an up to 4-in SiC wafer.
机译:在本报告中,我们演示了一个完整的霍尔效应元件,该元件基于在外延化学气相沉积工艺中在半绝缘的同轴Si端接6H-SiC衬底上合成的准自立式单层石墨烯。该器件具有87 V / AT的电流模式灵敏度和较低的过大噪声(Hooge参数α_H<2×10〜(-3)),在10 Hz时具有650 nT / Hz〜(0.5)的室温磁分辨率,在总有效面积为0.1275 mm〜2的情况下,在1 kHz下为95 nT / Hz〜(0.5),在100 kHz下为14 nT / Hz〜(0.5)。该元件用硅酮密封剂钝化以确保其电稳定性和耐环境性。它的加工周期适合于大规模的商业生产,并且可以通过在多达4英寸的SiC晶圆上一次生长来大量获得。

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  • 来源
    《Applied Physics Letters》 |2016年第22期|223504.1-223504.5|共5页
  • 作者单位

    Institute of Electronic Materials Technology, Wolczynska 133, 01-919 Warsaw, Poland,Institute of Microelectronics and Optoelectronics, Warsaw University of Technology, Koszykowa 75, 00-662 Warsaw, Poland;

    Industrial Research Institute for Automation and Measurements PIAP, Al. Jerozolimskie 202, 02-486 Warsaw, Poland;

    Institute of Electronic Materials Technology, Wolczynska 133, 01-919 Warsaw, Poland;

    Institute of Electronic Materials Technology, Wolczynska 133, 01-919 Warsaw, Poland;

    Institute of Radioelectronics and Multimedia Technology, Warsaw University of Technology, Koszykowa 75, 00-662 Warsaw, Poland;

    Institute of Microelectronics and Optoelectronics, Warsaw University of Technology, Koszykowa 75, 00-662 Warsaw, Poland;

    Institute of Electronic Materials Technology, Wolczynska 133, 01-919 Warsaw, Poland;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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  • 入库时间 2022-08-18 03:14:38

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