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Transparent indium-tin oxide/indium-gallium-zinc oxide Schottky diodes formed by gradient oxygen doping

机译:梯度氧掺杂形成的透明铟锡氧化物/铟镓锌氧化物肖特基二极管

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摘要

Amorphous InGaZnO (a-IGZO) is promising for transparent electronics due to its high carrier mobility and optical transparency. However, most metal/a-IGZO junctions are ohmic due to the Fermi-level pinning at the interface, restricting their device applications. Here, we report that indium-tin oxide/a-IGZO Schottky diodes can be formed by gradient oxygen doping in the a-IGZO layer that would otherwise form an ohmic contact. Making use of back-to-back a-IGZO Schottky junctions, a transparent IGZO permeable metal-base transistor is also demonstrated with a high common-base gain.
机译:非晶态InGaZnO(a-IGZO)具有高载流子迁移率和光学透明性,因此有望用于透明电子产品。但是,由于接口处的费米能级钉扎,大多数金属/ a-IGZO结都是欧姆性的,从而限制了它们的器件应用。在这里,我们报道铟锡氧化物/ a-IGZO肖特基二极管可以通过在a-IGZO层中掺杂梯度氧来形成,否则会形成欧姆接触。利用背靠背a-IGZO肖特基结,还展示了具有高共基极增益的透明IGZO渗透性金属基晶体管。

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  • 来源
    《Applied Physics Letters》 |2017年第21期|212103.1-212103.4|共4页
  • 作者单位

    Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, United States;

    Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, United States;

    Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, United States;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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