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On-chip measurement of waveforms in mixed-signal circuits using a segmented subsampling technique

机译:使用分段二次采样技术对混合信号电路中的波形进行片上测量

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This paper presents a circuit technique for the design of a wideband on-chip sampling oscilloscope in mixed-signal integrated circuits. A coupled Phase Locked Loop (PLL) and Delay Locked Loop (DLL) module is designed to generate a high-resolution sampling clock over a limited time interval. This module has been employed as an enabling circuit to support on-chip measurement of fast waveforms through a subsampling technique attaining less than 10 ps sampling resolution. Input waveforms are first divided into equal-size-segments in the time domain and then each segment is subsampled with the sampling clock supplied by the coupled PLL and DLL module. The proposed measurement scheme has been fabricated in CMOS 0.18 μm technology and the measurement results indicate that over 7 effective bits of measurement linearity can be achieved for input signals up to 1.6 GHz.
机译:本文提出了一种用于混合信号集成电路中的宽带片上采样示波器设计的电路技术。耦合锁相环(PLL)和延迟锁相环(DLL)模块旨在在有限的时间间隔内生成高分辨率采样时钟。该模块已被用作使能电路,以通过低于10 ps的采样分辨率的子采样技术来支持快速波形的片上测量。输入波形首先在时域中分成大小相等的段,然后使用耦合的PLL和DLL模块提供的采样时钟对每个段进行二次采样。拟议的测量方案已采用CMOS 0.18μm技术制造,测量结果表明,对于高达1.6 GHz的输入信号,可实现超过7个有效的测量线性度位。

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