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首页> 外文期刊>IEEE Transactions on Advanced Packaging >Experimental and Numerical Studies of Warpages of ACF-Bonded COG Packages Induced From Manufacturing and Thermal Cycling
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Experimental and Numerical Studies of Warpages of ACF-Bonded COG Packages Induced From Manufacturing and Thermal Cycling

机译:制造和热循环导致ACF键合的COG包装翘曲的实验和数值研究

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Regarding the application of the chip on glass (COG) with anisotropic conductive film (ACF) to the liquid crystal displays (LCDs), the problems with the warpage of COG packages, interfacial delamination, and increasing contact resistance of bumps, during or after thermal and moisture loading, are major reliability issues encountered in the industry. The goal in this paper is to investigate the effect of the parameters, such as bonding pressure and temperature during manufacturing, thermal and moisture expansion of the ACF, and its elastic modulus and fillets, associated with thermal cycling (from room temperature to 85 ${circ}{hbox{C}}$ ), on the warpages of the ACF-bonded COG packages. The full-field Twyman–Green interferometry is used for measuring the warpages of the COG packages due to the fabrication with the various bonding pressure and temperature and during thermal cycling. Three-dimensional finite-element models (FEM) are used for calculating the warpage in terms of such parameters, and those results are compared with experimental observations in order to understand the mechanics. The results show that the tremendously saddle-warped shapes are found at the COG packages after manufacturing, and their maximum warpages increase with the bonding pressure but are insensitive to the bonding temperature. However, these large warpages have been obviously relaxed as the temperature goes beyond 50 ${circ}{hbox{C}}$ during the first thermal cycling. After the first cycling, the warpages of the COG packages become much less severe and remain stably, then slightly increase with the temperature. The deformed behaviors of the COG package under the thermal loads have been resolved by comparing the FEM results with the experimental observations. The moisture-induced expansion strain of the saturated ACF in the condition of 29 ${circ}{hbox{C}}$/85%RH was determined to be 0.147% by means of the combination of experimental and theoretical analyses. It is also found that, for relatively thin fillets, the coefficient of thermal expansion (CTE) and moisture absorption of the ACF do not have any obvious influence on the warpages of the COG packages, but for relatively thick fillets they do somewhat. Moreover, the warpages of the COG package affected by ACF fillet thickness, elastic modulus, and CTE have been thoroughly studied by the finite-element analysis and the results have been interpreted in detail. Overall, for reducing the warpage of the COG package, two approaches are suggested: giving the packages at 85 ${circ}{hbox{C}}$ preheated after manufacturing and precisely controlling low mismatch of CTE between chip and glass substrate, since both play significant roles.
机译:关于将具有各向异性导电膜(ACF)的玻璃芯片(COG)应用于液晶显示器(LCD)的问题,在加热期间或之后,COG封装翘曲,界面分层以及凸点的接触电阻增加的问题和湿气负荷是行业中遇到的主要可靠性问题。本文的目的是研究参数的影响,例如制造过程中的粘合压力和温度,ACF的热和湿膨胀以及其弹性模量和圆角,这些参数与热循环(从室温到85 $ { circ} {hbox {C}} $),在ACF键合的COG封装的翘曲处。全场Twyman-Green干涉测量法用于测量COG封装的翘曲,这是由于在各种粘合压力和温度下以及在热循环过程中制造的。使用三维有限元模型(FEM)来根据这些参数计算翘曲,并将这些结果与实验观察结果进行比较,以了解其力学原理。结果表明,在制造后的COG封装中发现了极大的鞍形翘曲形状,并且其最大翘曲随着接合压力的增加而增加,但对接合温度不敏感。但是,随着温度在第一个热循环期间超过50 $ {hbox {C}} $,这些大的翘曲明显得到了缓解。第一次循环后,COG包装的翘曲变得不那么严重,并且保持稳定,然后随温度而略有增加。通过将FEM结果与实验结果进行比较,可以解决COG封装在热载荷下的变形行为。通过实验和理论分析相结合,确定了饱和ACF在29 $(circ){hbox {C}} $ / 85%RH条件下的水分诱导膨胀应变为0.147%。还发现,对于较薄的圆角,ACF的热膨胀系数(CTE)和吸湿率对COG包装的翘曲没有明显影响,但对于较厚的圆角,它们却有一定作用。此外,已经通过有限元分析深入研究了受ACF圆角厚度,弹性模量和CTE影响的COG封装的翘曲,并详细解释了结果。总体而言,为减少COG封装的翘曲,建议采用两种方法:在制造后对封装进行85℃的预热,并精确控制芯片与玻璃基板之间CTE的低失配,因为两者发挥重要作用。

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