首页> 外文期刊>Advanced Functional Materials >Immobilization of Quantum Dots in Nanostructured Porous Silicon Films: Characterizations and Signal Amplification for Dual-Mode Optical Biosensing
【24h】

Immobilization of Quantum Dots in Nanostructured Porous Silicon Films: Characterizations and Signal Amplification for Dual-Mode Optical Biosensing

机译:纳米结构多孔硅膜中量子点的固定化:双模光学生物传感的表征和信号放大。

获取原文
获取原文并翻译 | 示例

摘要

Highly sensitive dual-mode labeled detection of biotin in well-characterized porous silicon (PSi) films using colloidal quantum dots (QDs) as signal amplifiers are demonstrated. Optimization of the PSi platform for targeted QD infiltration and immobilization is carried out by characterizing and tuning the porosity, film depth, and pore size. Binding events of target QD-biotin conjugates with streptavidin probes immobilized on the pore walls are monitored by reflective interferometric spectroscopy and fluorescence measurements. QD labeling of the target biotin molecules enables detection based on a distinct fluorescent signal as well as a greater than 5-fold enhancement in the measured spectral reflectance fringe shift and a nearly three order of magnitude improvement in the detection limit for only 6% surface area coverage of QDs inside the porous matrix. Utilizing the QD signal amplifiers, an exceptional biotin detection limit of≈6 fg mm~(-2) is demonstrated with sub-fg mm~(-2) detection limits achievable.
机译:演示了使用胶体量子点(QD)作为信号放大器对表征良好的多孔硅(PSi)膜中的生物素进行高灵敏度的双模式标记检测。通过表征和调整孔隙率,膜深和孔径,针对目标QD渗透和固定化对PSi平台进行了优化。靶QD-生物素缀合物与固定在孔壁上的链霉亲和素探针的结合事件通过反射干涉光谱法和荧光测量来监测。目标生物素分子的QD标记可基于独特的荧光信号进行检测,并且所测得的光谱反射率条纹偏移增强了5倍以上,并且仅对6%的表面积就将检测极限提高了近三个数量级多孔基质内部QD的覆盖范围。利用QD信号放大器,证明了≈6fg mm〜(-2)的异常生物素检测极限,可达到亚fg mm〜(-2)的检测极限。

著录项

  • 来源
    《Advanced Functional Materials》 |2013年第29期|3604-3614|共11页
  • 作者单位

    Department of Electrical Engineering and Computer Science, Vanderbilt University Nashville, TN 37235, USA;

    Department of Chemistry Vanderbilt Institute of Nanoscale Science and Engineering Nashville, TN 37235, USA;

    Department of Electrical Engineering and Computer Science, Vanderbilt University Nashville, TN 37235, USA;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号