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An image-processing method to detect sub-optical features based on understanding noise in intensity measurements

机译:一种基于对强度测量中噪声的了解来检测亚光学特征的图像处理方法

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摘要

Accurate quantitative analysis of image data requires that we distinguish between fluorescence intensity (true signal) and the noise inherent to its measurements to the extent possible. We image multilamellar membrane tubes and beads that grow from defects in the fluid lamellar phase of the lipid 1,2-dioleoyl-sn-glycero-3-phosphocholine dissolved in water and water-glycerol mixtures by using fluorescence confocal polarizing microscope. We quantify image noise and determine the noise statistics. Understanding the nature of image noise also helps in optimizing image processing to detect sub-optical features, which would otherwise remain hidden. We use an image-processing technique “optimum smoothening” to improve the signal-to-noise ratio of features of interest without smearing their structural details. A high SNR renders desired positional accuracy with which it is possible to resolve features of interest with width below optical resolution. Using optimum smoothening, the smallest and the largest core diameter detected is of width 88 ± 23 and 6860 ± 50 nm, respectively, discussed in this paper. The image-processing and analysis techniques and the noise modeling discussed in this paper can be used for detailed morphological analysis of features down to sub-optical length scales that are obtained by any kind of fluorescence intensity imaging in the raster mode.Electronic supplementary materialThe online version of this article (10.1007/s00249-017-1273-z) contains supplementary material, which is available to authorized users.
机译:对图像数据进行准确的定量分析要求我们尽可能区分荧光强度(真实信号)和其测量固有的噪声。我们使用荧光共聚焦偏振显微镜对多层膜管和珠子进行成像,这些管子和珠子是由溶解在水和水-甘油混合物中的脂质1,2-二油酰基-sn-甘油-3-磷酸胆碱的流体层相中的缺陷而形成的。我们量化图像噪声并确定噪声统计数据。理解图像噪声的本质还有助于优化图像处理以检测亚光学特征,否则这些亚光学特征将保持隐藏状态。我们使用图像处理技术“最佳平滑”来改善目标特征的信噪比,而不会抹杀其结构细节。高SNR可提供所需的位置精度,利用该精度可以解析宽度低于光学分辨率的目标特征。使用最佳平滑处理,本文讨论的最小和最大芯径分别为宽度88±23和6860±50 nm。本文讨论的图像处理和分析技术以及噪声建模可用于对特征进行细致的形态分析,这些特征可通过光栅模式通过任何一种荧光强度成像获得的亚光学长度尺度。本文的版本(10.1007 / s00249-017-1273-z)包含补充材料,可供授权用户使用。

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