Effects of Ambient Gases on the Electrical Performance of Solution-Processed C8-BTBT Thin-Film Transistors

摘要

(Color online) ( ) A schematic diagram of the device structure. ( ) The molecular structures of the C8-BTBT, molybdenum oxide, and PMMA used in the experiment. ( ) AFM surface morphology image of the C8-BTBT film indicating a small RMS value of 2.08 nm. ( ) Test procedures used to measure the electrical performance characteristics of 70 units of each device type (high vacuum, nitrogen atmosphere, oxygen atmosphere, and air atmosphere)