首页> 美国卫生研究院文献>Nanoscale Research Letters >Multidimensional characterization Landau levels and Density of States in epitaxial graphene grown on SiC substrates
【2h】

Multidimensional characterization Landau levels and Density of States in epitaxial graphene grown on SiC substrates

机译:SiC衬底上生长的外延石墨烯的多维表征Landau能级和态密度

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

Using high-temperature annealing conditions with a graphite cap covering the C-face of, both, on axis and 8° off-axis 4H-SiC samples, large and homogeneous single epitaxial graphene layers have been grown. Raman spectroscopy shows evidence of the almost free-standing character of these monolayer graphene sheets, which was confirmed by magneto-transport measurements. On the best samples, we find a moderate p-type doping, a high-carrier mobility and resolve the half-integer quantum Hall effect typical of high-quality graphene samples. A rough estimation of the density of states is given from temperature measurements.
机译:使用带有石墨盖的高温退火条件,该石墨盖覆盖轴向和垂直于8°离轴4H-SiC样品的C面,已经生长出大而均匀的单外延石墨烯层。拉曼光谱法显示了这些单层石墨烯片材几乎独立的特征,这一点已通过磁传输测量得到了证实。在最佳样品上,我们发现了中等p型掺杂,高载流子迁移率,并解决了高质量石墨烯样品中典型的半整数量子霍尔效应。根据温度测量结果可以粗略估计出状态密度。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号