采用ICP-AES测定高纯氢氧化钠中Ca、Al、Si的含量

摘要

介绍了等离子体原子发射光谱,采用标准加入法测定高纯氢氧化钠中痕量Ca、Al、Si含量的方法,该方法的准确度和精密度都符合定量要求。目前,该方法已应用于高纯氢氧化钠中杂质氧化钙、氧化铝、氧化硅含量的测定,且具有操作简便、省时、省材和高灵敏度等特点,适用于批量样品的测定。%This report introduces a novel method to determine the concentration of trace impurities in high- purity sodium hydroxide. The method uses ICP-AES combined with standard addition, thus its accuracy and precision fits the requirement of quantitative measurement. This method has been successfully applied to determine the concentration of calcium oxide （CaO）, aluminum oxide （A1203） and silicon dioxide （SiO2） in high-purity sodium hydroxide. The method is not only convenient, fast but also very sensitive, therefore is suitable for batch analysis.