首页> 外文学位 >Silicon carbide JFET integrated circuit technology for high-temperature sensors.
【24h】

Silicon carbide JFET integrated circuit technology for high-temperature sensors.

机译:用于高温传感器的碳化硅JFET集成电路技术。

获取原文
获取原文并翻译 | 示例

摘要

N-channel, 6H-SiC depletion-mode JFETs have been designed and characterized for high-temperature integrated circuit applications. The electrical characteristics of the JFETs have been measured from 25oC to 600°C and match predictions of an abrupt-junction, long-channel JFET model. The extracted threshold voltage has a temperature dependence of about -1.9 mV/°C for temperatures up to 450°C. On one wafer, forty transistors were characterized, the extracted pinch-off current has a mean of 0.41 mA and standard deviation of ∼0.10 mA, whereas threshold voltage has a mean of -8.5 V and standard deviation of ∼1.0 V.;The characterization of differential pairs and hybrid amplifiers constructed using these transistors is also reported. A three-stage amplifier with passive loads has a differential voltage gain of 50 dB and a unity-gain frequency of 200 kHz at 450°C, limited by test parasitics. A two-stage amplifier with active loads has reduced sensitivity to off-chip parasitics and exhibits a differential voltage gain of 69 dB with a unity-gain frequency of 1.3 MHz at 450°C.;Feasibility of the 6H-SiC JFET integrated circuit technology for high-temperature analog circuits is demonstrated with a number of amplifier design examples. A single-stage amplifier with resistor loads has differential voltage gain ∼36 dB and unity-gain frequency ∼2.8 MHz at 600°C with remarkably stable voltage gain, i.e. less than 1 dB variation from 25°C to 600°C. A single-stage amplifier with current-source loads has differential voltage gain ∼39 dB and unity-gain frequency ∼2.1 MHz at 450°C. A single-stage amplifier with current-source loads, cascoded driver, and common-mode feedback has a differential voltage gain ∼44.4 dB, unity-gain frequency ∼2.8 MHz, and less than 1.4 dB gain variation for temperatures up to 450°C. A two-stage amplifier with current-source loads in the 1 st stage and resistor loads in the 2nd stage has a differential mode gain of about 69 dB, and unity-gain frequency of 1.4 MHz at 576°C, and less than ∼3.6 dB gain variation from 25°C to 576°C.;A single-stage, single-ended transimpedance amplifier has low-frequency gain ∼207 kO at room temperature and ∼1.1 MO at 450°C, and gain variation for copies on a 6 mm x 6 mm die is within 2%.
机译:N沟道6H-SiC耗尽型JFET已针对高温集成电路应用进行了设计和表征。已在25oC至600°C的温度范围内测量了JFET的电特性,并与突变结长沟道JFET模型的预测相符。对于高达450°C的温度,提取的阈值电压具有约-1.9 mV /°C的温度依赖性。在一个晶片上,表征了40个晶体管,提取的夹断电流的平均值为0.41 mA,标准偏差约为0.10 mA,而阈值电压的平均值为-8.5 V,标准偏差约为1.0 V.还报道了使用这些晶体管构造的差分对和混合放大器的示意图。具有无源负载的三级放大器在450°C时具有50dB的差分电压增益和200kHz的单位增益频率,受测试寄生条件的限制。具有有源负载的两级放大器降低了对片外寄生虫的敏感度,并在450°C时具有69 dB的差分电压增益和1.3 MHz的单位增益频率; 6H-SiC JFET集成电路技术的可行性大量放大器设计实例演示了用于高温模拟电路的电路。具有电阻负载的单级放大器在600°C时的差分电压增益为〜36 dB,单位增益频率为〜2.8 MHz,电压增益非常稳定,即从25°C到600°C的变化小于1 dB。具有电流源负载的单级放大器在450°C时的差分电压增益约为39 dB,单位增益频率约为2.1 MHz。具有电流源负载,共源共栅驱动器和共模反馈的单级放大器的差分电压增益约为44.4 dB,单位增益频率约为2.8 MHz,在温度高达450°C的情况下增益变化小于1.4 dB 。具有第一级电流源负载和第二级电阻负载的两级放大器在576°C时具有约69 dB的差分模式增益和1.4 MHz的单位增益频率,并且小于约3.6从25°C到576°C的dB增益变化;单级,单端跨阻放大器在室温下的低频增益为〜207 kO,在450°C的情况下为〜1.1 MO,并且在6毫米x 6毫米模具的误差在2%以内。

著录项

  • 作者

    Patil, Amita C.;

  • 作者单位

    Case Western Reserve University.;

  • 授予单位 Case Western Reserve University.;
  • 学科 Engineering Electronics and Electrical.
  • 学位 Ph.D.
  • 年度 2009
  • 页码 178 p.
  • 总页数 178
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 无线电电子学、电信技术;
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号