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Ion-assisted chemical vapor deposition of thin film cubic boron nitride.

机译:薄膜立方氮化硼的离子辅助化学气相沉积。

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In this thesis, a new arcjet ion-assisted chemical vapor deposition (IACVD) process was developed along with diagnostic techniques to investigate the growth of thin films of cubic boron nitride (c-BN). The objective was to gain a better understanding of the physical limitations of the IACVD process, to successfully quantify some of the parameters which control c-BN growth and to characterize the material properties of the c-BN films.; To better characterize ion bombardment at the biased substrate in the vapor deposition reactor, a retarding potential analyzer (RPA) was designed and implemented to measure the ion flux, the electrical sheath thickness at the substrate, and the energy distribution of the ion beam bombarding the growing film. The dependence of the ion energy distribution, and thus c-BN deposition, on various process parameters was investigated. To verify the RPA measurements, monte carlo calculations were performed to simulate the transport of ions across the sheath and to calculate the ion energy distribution.; In order to characterize the c-BN films grown in this study, several spectroscopic diagnostics were utilized. A damped classic oscillator model was developed to provide quantitative values for volumetric phase fractions and film thickness from infrared transmission spectra of the boron nitride films. X-ray photoelectron spectroscopy (XPS) characterization of the BN films was performed to determine atomic concentrations in the films and as a fingerprint for sp{dollar}sp2{dollar} bonding through identification of a {dollar}pi{dollar} plasmon spectral feature. Near edge x-ray absorption fine structure (NEXAFS) spectroscopy was used to verify the calculated c-BN content in the films obtained by the model fits of IR transmission spectra. This verification was performed through the identification of distinct NEXAFS spectral features caused by sp{dollar}sp3{dollar} and sp{dollar}sp2{dollar} bonding in the films. The study was concluded with the discussion and application of a multi-layer growth, stress-induced phase change theory for the deposition of c-BN films. Using the conceptual backbone of this theory, a first order model for the thermodynamic energy balance on a growing c-BN film was developed. The model predicts that film stress, and thus c-BN growth, is dependent on the ion momentum flux at the growth surface.
机译:本文研究了一种新的电弧喷射离子辅助化学气相沉积(IACVD)工艺以及诊断技术,以研究立方氮化硼(c-BN)薄膜的生长。目的是更好地了解IACVD工艺的物理局限性,以成功地量化一些控制c-BN生长的参数并表征c-BN膜的材料特性。为了更好地表征在气相沉积反应器中偏压基板上的离子轰击,设计并实施了一种延迟电势分析仪(RPA)以测量离子通量,基板上的电鞘厚度以及离子束轰击离子阱的能量分布。电影。研究了离子能量分布以及c-BN沉积对各种工艺参数的依赖性。为了验证RPA测量值,进行了蒙特卡洛计算,以模拟离子在护套中的传输并计算离子能量分布。为了表征本研究中生长的c-BN膜,利用了几种光谱学诊断方法。开发了阻尼经典振荡器模型,以根据氮化硼薄膜的红外透射光谱提供体积相分数和薄膜厚度的定量值。进行了BN薄膜的X射线光电子能谱(XPS)表征,以确定薄膜中的原子浓度,并通过识别{dol} pi {dollar}等离子体激元光谱特征,作为sp {dollar} sp2 {dollar}键合的指纹。使用近边缘X射线吸收精细结构(NEXAFS)光谱来验证通过红外透射光谱的模型拟合获得的膜中计算出的c-BN含量。通过鉴定由膜中的sp {dollar} sp3 {dollar}和sp {dollar} sp2 {dollar}结合引起的独特的NEXAFS光谱特征来进行此验证。讨论结束并讨论了多层生长,应力诱导相变理论在c-BN膜沉积中的应用。利用该理论的概念主干,建立了生长的c-BN薄膜上热力学能量平衡的一阶模型。该模型预测膜应力以及c-BN的生长取决于生长表面的离子动量通量。

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