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Chemical mechanical polishing (CMP) of sapphire.

机译:蓝宝石的化学机械抛光(CMP)。

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The concept of chemical mechanical polishing (CMP) was examined for finishing sapphire. In this study sapphire was used as a model system for oxide ceramics. The removal rates were determined by weight loss. Surface quality and structure were characterized with surface probe microscopy (SPM).; Polishing experiments were designed to test the chemically modified surface layer. A series of abrasives with various hardnesses including mono-crystalline and polycrystalline diamond, alpha and gamma alumina, zirconia, ceria and silica were used. Diaspore was also evaluated. The results indicated that, with similar particle size and shape, harder abrasives do not necessarily cause faster material removal and better surface finish, and abrasives with hardness equal to or less than sapphire such as alpha alumina and gamma alumina achieved the best surface finish and efficient material removal. A hypothesis was proposed that the sapphire surface was modified by water to form a thin hydration laver with structure and hardness close to diaspore. Abrasives with a hardness between diaspore and sapphire polished the c-plane of sapphire with good surface finish and efficient removal. SPM indicated the hydration layer on the c-plane surface was about 1 nm thick.; Removal rate and surface finish as a function of pH were also examined on c-plane sapphire with nano-alumina abrasives. The removal rate as a function of pH was compared to the solubility behavior of alumina. The results showed the deviation of pH from the lowest solubility pH for alumina (pH = 5) was a driving force for the surface reaction to form a hydration layer.; The anisotropy of sapphire strongly affects removal rate and surface quality in CMP. The relationships among orientation. pH and abrasive were studied for sapphire with c (0001), a (11-20), and m (10-10) planes.; Based on the results, the CMP process for sapphire includes chemical reaction of the surface to form a thin reaction layer that is softer than sapphire. This reaction layer can be removed by an abrasive that is softer than sapphire but harder than the reaction layer. Good removal rate and surface finish with presumably low subsurface damage can be achieved by this process. The results show the potential for cost reduction and quality improvement in industrial finishing of sapphire and perhaps other hard materials.
机译:对化学机械抛光(CMP)的概念进行了蓝宝石精加工。在这项研究中,蓝宝石被用作氧化物陶瓷的模型系统。去除率由体重减轻确定。表面质量和结构用表面探针显微镜(SPM)表征。设计抛光实验以测试化学改性的表面层。使用了一系列具有各种硬度的磨料,包括单晶和多晶金刚石,α和γ氧化铝,氧化锆,二氧化铈和二氧化硅。还评估了硬孢子。结果表明,在具有相似的粒径和形状的情况下,较硬的磨料并不一定会导致更快的材料去除和更好的表面光洁度,而硬度等于或小于蓝宝石的磨料(例如α氧化铝和γ氧化铝)可获得最佳的表面光洁度和效率材料去除。提出了一种假设,即通过水对蓝宝石表面进行改性以形成一种薄水化紫菜,其结构和硬度接近于diaspore。硬质合金在硬质合金和蓝宝石之间的磨料抛光了蓝宝石的 c 平面,具有良好的表面光洁度和有效的去除效果。 SPM表明, 平面表面上的水合层约为1 nm厚。还用纳米氧化铝磨料在 c 平面蓝宝石上检查了去除率和表面光洁度随pH的变化。将去除速率随pH的变化与氧化铝的溶解性能进行了比较。结果表明,pH值与氧化铝的最低溶解度pH值(pH = 5)之间的偏差是表面反应形成水合层的驱动力。蓝宝石的各向异性强烈影响CMP的去除率和表面质量。方向之间的关系。用 c (0001), a (11-20)和 m (10-10)平面研究了pH和磨料中的蓝宝石。 ;基于该结果,用于蓝宝石的CMP工艺包括表面的化学反应以形成比蓝宝石更软的薄反应层。该反应层可以用比蓝宝石更软但比反应层更硬的磨料去除。通过此工艺可以实现良好的去除率和表面光洁度,并且表面下的损坏可能较低。结果表明,在蓝宝石和其他硬质材料的工业精加工中,有可能降低成本并提高质量。

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