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Power and leakage minimization for digital ICs.

机译:数字IC的功耗和泄漏最小化。

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摘要

This work targets power minimization in digital integrated circuits (ICs). A globally optimal Lagrangian relaxation based algorithm was developed that robustly minimizes the total active area (the sum of all transistor widths), thus minimizing power, needed for any feasible delay target assuming arbitrary (continuous) cell sizes. An accurate table-lookup delay model was developed from the pre-characterized industrial standard cell library data by making a formal extension to the concept of logical effort which enables optimization of nMOS and pMOS sizes of a cell separately. Then, a new delay-bounded dynamic programming based algorithm was developed that maps the continuous sizes to the discrete sizes available in the standard cell library which achieves active area versus delay results close to the continuous sizing results. Parallelism was incorporated into the algorithm to enhance efficiency by leveraging multi-core processors. Next, a new threshold voltage (VT) selection algorithm was developed that minimizes leakage power while strictly preserving the delay constraint. A key aspect of the approach is a slack-leakage cost function that is globally aware of the entire circuit. The lowest cost cell is swapped to the next highest available VT, as long as the delay is not increased. The procedure iterates until no cell can feasibly be swapped to a higher VT. Finally, a new power optimization flow was presented utilizing separate synthesis and physical cell libraries. The physical library consists of the most power efficient cells whereas the synthesis library includes additional complex cells, which are compound compositions of cells from the physical library. After using state-of-the-art commercial synthesis, the application of the new cell size selection tool resulted in a 36% reduction (on average) in active area. The application of the new VT selection algorithm combined with the near optimal cell size selection tool demonstrated a leakage power reduction of 70% (on average) for single-VT synthesis and 37% (on average) for multi-VT synthesis of industrial designs. The dual library approach resulted in a 13% reduction in active area for the same delay compared to a 40nm industrial library. All the algorithms are efficient, with an ability to handle large commercial designs.
机译:这项工作的目标是使数字集成电路(IC)的功耗最小化。开发了一种基于全局最优拉格朗日松弛的算法,该算法可鲁棒地最小化总有效面积(所有晶体管宽度之和),从而最小化假设任意(连续)像元大小的任何可行延迟目标所需的功率。通过对逻辑工作量的概念进行正式扩展,从预先表征的工业标准单元库数据中开发出了精确的表查找延迟模型,该逻辑工作量可以分别优化单元的nMOS和pMOS大小。然后,开发了一种新的基于延迟约束的动态规划算法,该算法将连续大小映射到标准单元库中可用的离散大小,从而实现了有效面积与延迟结果接近连续大小的结果。并行算法被并入算法中,以利用多核处理器来提高效率。接下来,开发了一种新的阈值电压(VT)选择算法,该算法可最小化泄漏功率,同时严格保留延迟约束。该方法的一个关键方面是松弛泄漏成本函数,该函数全局了解整个电路。只要延迟不增加,最低成本的单元将交换到下一个最高可用VT。该过程反复进行,直到没有任何单元可以切实地交换到更高的VT。最后,提出了一种利用独立的综合库和物理单元库的新功率优化流程。物理文库由功率效率最高的细胞组成,而合成文库包含其他复杂细胞,这些细胞是物理文库中细胞的复合成分。在使用最新的商业合成方法之后,新的细胞大小选择工具的应用导致有效面积减少了36%(平均)。新的VT选择算法与近乎最佳的像元大小选择工具相结合的应用表明,工业设计的单VT合成泄漏功率降低了70%(平均),多VT合成泄漏功率降低了37%(平均)。与40nm工业库相比,双库方法在相同的延迟下导致有效面积减少了13%。所有算法都是有效的,并且能够处理大型商业设计。

著录项

  • 作者

    Rahman, Mohammad Moshiur.;

  • 作者单位

    The University of Texas at Dallas.;

  • 授予单位 The University of Texas at Dallas.;
  • 学科 Engineering Electronics and Electrical.
  • 学位 Ph.D.
  • 年度 2011
  • 页码 129 p.
  • 总页数 129
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 康复医学;
  • 关键词

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