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Methodology for Standby Leakage Power Reduction in Nanometer-Scale CMOS Circuits.

机译:纳米级CMOS电路中降低待机泄漏功率的方法。

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摘要

In nanometer-scale CMOS technology, leakage power has become a major component of the total power dissipation due to the downscaling of threshold voltage and gate oxide thickness. The leakage power consumption has received even more attention by increasing demand for mobile devices. Since mobile devices spend a majority of their time in a standby mode, the leakage power savings in standby state is critical to extend battery lifetime. For this reason, low power has become a major factor in designing CMOS circuits.;In this dissertation, we propose a novel transistor reordering methodology for leakage reduction. Unlike previous technique, the proposed method provides exact reordering rules for minimum leakage formation by considering all leakage components. Thus, this method formulates an optimized structure for leakage reduction even in complex CMOS logic gate, and can be used in combination with other leakage reduction techniques to achieve further improvement.;We also propose a new standby leakage reduction methodology, leakage-aware body biasing, to overcome the shortcomings of a conventional Reverse Body Biasing (RBB) technique. The RBB technique has been used to reduce subthreshold leakage current. Therefore, this technique works well under subthreshold dominant region even though it has intrinsic structural drawbacks. However, such drawbacks cannot be overlooked anymore since gate leakage has become comparable to subthreshold leakage in nanometer-scale region. In addition, BTBT leakage also increases with technology scaling due to the higher doping concentration applied in each process technology. In these circumstances, the objective of leakage minimization is not a single leakage source but the overall leakage sources. The proposed leakage-aware body biasing technique, unlike conventional RBB technique, considers all major leakage sources to minimize the negative effects of existing body biasing approach. This can be achieved by intelligently applying body bias to appropriate CMOS network based on its status (on-/off-state) with the aid of a pin/transistor reordering technique.
机译:在纳米级CMOS技术中,由于阈值电压和栅氧化层厚度的缩减,泄漏功率已成为总功耗的主要组成部分。通过增加对移动设备的需求,泄漏功耗得到了越来越多的关注。由于移动设备大部分时间都处于待机模式,因此节省待机状态下的泄漏功率对于延长电池寿命至关重要。因此,低功耗已成为设计CMOS电路的主要因素。本论文中,我们提出了一种新颖的晶体管重排序方法,以减少泄漏。与以前的技术不同,所提出的方法通过考虑所有泄漏分量为最小泄漏形成提供了精确的重新排序规则。因此,该方法即使在复杂的CMOS逻辑门中也可为泄漏减少制定优化的结构,并且可以与其他泄漏减少技术结合使用以实现进一步的改进。;我们还提出了一种新的待机泄漏减少方法,即泄漏感知主体偏置,以克服常规反向车身偏置(RBB)技术的缺点。 RBB技术已用于减少亚阈值泄漏电流。因此,即使具有固有的结构缺陷,该技术在亚阈值主导区域下也能很好地工作。然而,由于栅极泄漏已经变得与纳米级区域中的亚阈值泄漏相当,因此这些缺点不再可忽略。此外,由于每种工艺技术中所采用的较高掺杂浓度,BTBT泄漏也会随着技术规模的增加而增加。在这些情况下,最小化泄漏的目标不是单个泄漏源,而是整个泄漏源。与传统的RBB技术不同,拟议中的泄漏感知车身偏置技术考虑了所有主要的泄漏源,以最大程度地降低现有车身偏置方法的负面影响。这可以通过借助引脚/晶体管重新排序技术,根据其状态(导通/截止状态)将体偏置智能地应用于适当的CMOS网络来实现。

著录项

  • 作者

    Chun, Jae Woong.;

  • 作者单位

    Syracuse University.;

  • 授予单位 Syracuse University.;
  • 学科 Engineering Computer.;Engineering Electronics and Electrical.
  • 学位 Ph.D.
  • 年度 2012
  • 页码 166 p.
  • 总页数 166
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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