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LEAKAGE CURRENT REDUCTION FOR CMOS MEMORY CIRCUITS.

机译:CMOS存储器电路的漏电流降低。

摘要

A CMOS integrated circuit (e.g., an SRAM or a DRAM) is partitioned into a core block, a peripheral block, and a retention block. The core block includes circuits (e.g., memory cells) that are powered on at all times and is coupled directly to power supply and circuit ground. The peripheral block includes circuits that may be powered on or off and are coupled to the power supply via a head switch and/or to circuit ground via a foot switch. The switches and the core block may be implemented with high threshold voltage (high-Vt) FET devices to reduce leakage current. The peripheral block may be implemented with low-Vt FET devices for high-speed operation. The retention block includes circuits (e.g., pull-up devices) that maintain signal lines (e.g., word lines) at a predetermined level so that the internal states of the core block are retained when the peripheral block is powered off.
机译:CMOS集成电路(例如,SRAM或DRAM)被划分为核心块,外围块和保持块。核心块包括一直通电并且直接耦合到电源和电路接地的电路(例如,存储单元)。外围块包括可以通电或断电的电路,并通过前部开关连接到电源和/或通过脚踏开关连接到电路接地。开关和核心块可以利用高阈值电压(高Vt)的FET器件来实现,以减小泄漏电流。外围模块可以用低Vt FET器件实现高速运行。保持块包括将信号线(例如,字线)保持在预定电平的电路(例如,上拉装置),从而在外围块断电时保持核心块的内部状态。

著录项

  • 公开/公告号MXPA05010504A

    专利类型

  • 公开/公告日2005-11-16

    原文格式PDF

  • 申请/专利权人 QUALCOMM INCORPORATED.;

    申请/专利号MX2005PA10504

  • 发明设计人 CHENG ZHONG;

    申请日2004-04-02

  • 分类号G11C11/412;G11C11/417;

  • 国家 MX

  • 入库时间 2022-08-21 21:38:31

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