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Materials, design and processing of air encapsulated MEMS packaging.

机译:空气封装MEMS封装的材料,设计和加工。

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摘要

This work uses a three-dimensional air cavity technology to improve the fabrication, and functionality of microelectronics devices, performance of on-board transmission lines, and packaging of micro-electromechanical systems (MEMS). The air cavity process makes use of the decomposition of a patterned sacrificial polymer followed by the diffusion of its by-products through a curing polymer overcoat to obtain the embedded air structure. Applications and research of air cavities have focused on simple designs that concentrate on the size and functionality of the particular device. However, a lack of guidelines for fabrication, materials used, and structural design has led to mechanical stability issues and processing refinements.;This work investigates improved air gap cavities for use in MEMS packaging processes, resulting in fewer fabrication flaws and lower cost. The identification of new materials, such as novel photo-definable organic/inorganic hybrid polymers, was studied for increased strength and rigidity due to their glass-like structure. A novel epoxy polyhedral oligomeric silsesquioxane (POSS) material was investigated and characterized for use as a photodefineable, permanent dielectrics with improved mechanical properties. The POSS material improved the air gap fabrication because it served as a high-selectivity etch mask for patterning sacrificial materials as well as a cavity overcoat material with improved rigidity. An investigation of overcoat thickness and decomposition kinetics provided a fundamental understanding of the properties that impart mechanical stability to cavities of different shape and volume. Metallization of the cavities was investigated so as to provide hermetic sealing and improved cavity strength. The improved air cavity, wafer-level packages were tested using resonator-type devices and chip-level lead frame packaging. The air cavity package was molded under traditional lead frame molding pressures and tested for mechanical integrity. The development of mechanical models complimented the experimental studies. A model of the overcoat materials used the film properties and elastic deformations to study the stress-strain behavior of the suspended dielectric films under external forces. The experimental molding tests and mechanical models were used to establish processing conditions and physical designs for the cavities as a function of cavity size. A novel, metal-free chip package was investigated combining the in-situ thermal decomposition of the sacrificial material during post-mold curing of the lead frame molding compound. Sacrificial materials were characterized for their degree of decomposition during the molding cure to provide a chip package with improved mechanical support and no size restrictions.;Improvements to the air cavities for MEMS packaging led to investigations and refinements of other microfabrication processes. The sacrificial polycarbonate materials were shown to be useful as temporary bonding materials for wafer-level bonding. The release temperature and conditions of the processed wafer can be changed based on the polycarbonates formulation. The electroless deposition of metal was investigated as an alternative process for metalizing the air cavities. The deposition of silver and copper using a Sn/Ag catalyst as a replacement for costly palladium activation was demonstrated. The electroless deposition was tested on polymer and silicon dioxide surfaces for organic boards and through-silicon vias.
机译:这项工作使用三维气腔技术来改善微电子设备的制造,功能,车载传输线的性能以及微机电系统(MEMS)的包装。气腔工艺利用图案化的牺牲聚合物的分解,然后使其副产物通过固化的聚合物外涂层扩散,从而获得嵌入式空气结构。气腔的应用和研究集中在简单的设计上,这些设计专注于特定设备的尺寸和功能。但是,由于缺乏有关制造,使用的材料和结构设计的准则,导致了机械稳定性问题和工艺改进。;这项工作研究了用于MEMS封装工艺的气隙腔的改进,从而减少了制造缺陷并降低了成本。研究了鉴定新材料(例如新型可光定义的有机/无机杂化聚合物)以提高强度和刚度的原因,因为它们具有类似玻璃的结构。研究了一种新型的环氧多面体低聚倍半硅氧烷(POSS)材料,并将其表征为具有改善的机械性能的可光定义的永久电介质。 POSS材料改善了气隙的制造,因为它可以用作用于对牺牲材料进行构图的高选择性蚀刻掩模以及具有提高的刚度的型腔外涂层材料。对保护层厚度和分解动力学的研究提供了对赋予不同形状和体积的型腔机械稳定性的特性的基本理解。对空腔的金属化进行了研究,以提供气密密封并提高空腔强度。使用谐振器型器件和芯片级引线框架封装对改进的气腔,晶圆级封装进行了测试。气腔封装是在传统的引线框架成型压力下成型的,并进行了机械完整性测试。力学模型的发展补充了实验研究。外涂层材料的模型利用膜的特性和弹性变形来研究悬浮电介质膜在外力作用下的应力-应变行为。实验模制测试和力学模型被用来建立模腔的加工条件和物理设计,作为模腔尺寸的函数。研究了一种新颖的,不含金属的芯片封装,结合了引线框架成型材料在成型后固化过程中牺牲材料的原位热分解。牺牲材料的特征在于其在模制固化过程中的分解程度,从而提供具有改善的机械支撑并且没有尺寸限制的芯片封装。对MEMS封装的气孔的改进导致对其他微加工工艺的研究和改进。牺牲聚碳酸酯材料显示出可用作晶片级键合的临时键合材料。可以根据聚碳酸酯的配方改变已处理晶片的释放温度和条件。对金属的化学沉积进行了研究,作为金属化气腔的替代方法。演示了使用Sn / Ag催化剂代替昂贵的钯活化进行银和铜的沉积。在有机板和硅通孔的聚合物和二氧化硅表面上测试了化学沉积。

著录项

  • 作者

    Fritz, Nathan T.;

  • 作者单位

    Georgia Institute of Technology.;

  • 授予单位 Georgia Institute of Technology.;
  • 学科 Chemistry Polymer.;Engineering Materials Science.;Engineering Chemical.
  • 学位 Ph.D.
  • 年度 2012
  • 页码 141 p.
  • 总页数 141
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

  • 入库时间 2022-08-17 11:43:27

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