首页> 外文学位 >Flex cracking and temperature-humidity-bias effects on reliability of multilayer ceramic capacitors.
【24h】

Flex cracking and temperature-humidity-bias effects on reliability of multilayer ceramic capacitors.

机译:挠曲裂纹和温度-湿度-偏压对多层陶瓷电容器可靠性的影响。

获取原文
获取原文并翻译 | 示例

摘要

Multilayer ceramic capacitors (MLCCs) are known to be susceptible to cracking when subjected to excessive printed circuit board (PCB) flexure, which is called "flex cracking". The bending of the printed circuit board causes stresses to be transmitted through the solder fillets to the surface mount capacitors. These stresses are the highest at the bottom of the capacitor, where the termination bands end. In order to reduce the amount of stress that is transmitted to the brittle ceramic body of MLCCs through end terminations, a flexible termination system which incorporates a silver-loaded epoxy in end-terminations was developed by some MLCC manufacturers.;With the transition to lead-free materials in the electronics industry there is a concern that MLCCs assembled on PCBs with lead-free solder have different susceptibility to flex cracking than those assembled with eutectic tin-lead solder. In this study, the flex cracking of MLCCs assembled with lead-free solder (Sn3.0Ag0.5Cu) was compared with those assembled with eutectic tin-lead (Sn37Pb) solder and differences in the results were explained in terms of solder mechanical properties and solder solidification temperature. Tin-silver-copper lead-free solders and eutectic tin-lead solder have different mechanical properties, which affect the stresses that are transmitted to the ceramic body of the capacitor through the solder fillet. The higher solidification temperature for lead-free solder leads to increased residual compressive stresses after the reflow cool-down process for MLCCs assembled with lead-free solder compared with those assembled with tin-lead solder. In this work, the effects of dielectric material, capacitor size, solder assembly process, solder material, and end-termination type on flex cracking of MLCCs were determined for MLCCs from different manufacturers.;Since some flexible- and standard-termination MLCCs are made with precious metal electrodes (silver-palladium), there is a possibility of electrochemical silver migration under bias and humidity. In this study, the effects of temperature-humidity-bias on electrical parameters of flexible-termination MLCCs were characterized and compared with standard-termination MLCCs. In addition, the effect of temperature-humidity-bias on electrical parameters of MLCCs with base metal electrodes was compared to that for precious metal electrode capacitors.
机译:已知多层陶瓷电容器(MLCC)在经受过度的印刷电路板(PCB)弯曲时容易破裂,这被称为“弯曲破裂”。印刷电路板的弯曲会导致应力通过焊脚传递到表面安装电容器。这些应力在端接带终止的电容器底部最高。为了减少通过端接端子传递到MLCC脆性陶瓷体的应力,一些MLCC制造商开发了在端接端子中结合了银载环氧树脂的柔性端接系统。电子行业中的无铅材料令人担忧,用无铅焊料组装在PCB上的MLCC与用共晶锡铅焊料组装的MLCC具有不同的挠曲开裂敏感性。在这项研究中,将使用无铅焊料(Sn3.0Ag0.5Cu)组装的MLCC与使用共晶锡铅(Sn37Pb)焊料组装的MLCC的挠曲开裂进行了比较,并从焊料的机械性能和焊料凝固温度。锡银铜无铅焊料和共晶锡铅焊料具有不同的机械性能,这些机械性能会影响通过焊角传递到电容器陶瓷体的应力。与使用锡铅焊料组装的MLCC相比,使用无铅焊料的MLCC在回流冷却后,较高的凝固温度会导致残留压缩应力增加。在这项工作中,确定了不同制造商生产的MLCC的电介质材料,电容器尺寸,焊料组装工艺,焊料材料和端接类型对MLCC挠曲开裂的影响;由于制造了一些具有柔性和标准端接的MLCC如果使用贵金属电极(银钯),则在偏压和湿度下电化学银迁移的可能性很大。在这项研究中,温湿度偏置对柔性端接MLCC的电参数的影响进行了表征,并与标准端接MLCC进行了比较。此外,还比较了温度-湿度偏差对带有贱金属电极的MLCC的电参数的影响与对贵金属电极电容器的影响。

著录项

  • 作者

    Keimasi, Mohammadreza.;

  • 作者单位

    University of Maryland, College Park.;

  • 授予单位 University of Maryland, College Park.;
  • 学科 Engineering Mechanical.
  • 学位 Ph.D.
  • 年度 2006
  • 页码 181 p.
  • 总页数 181
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号