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THE IMPACT OF INHIBITOR LEVELS ON CORROSION DURING COPPER CMP

机译:缓蚀剂水平对铜CMP过程中腐蚀的影响

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摘要

1-H Benzotriazole (BTA) has been in use for the inhibition of the corrosion of copper metallization during the processing of integrated circuits. This paper discusses the need for control of the BTA concentration during processing. It presents a rapid, in-line, technique for monitoring the BTA concentration through a spectrometric technique; and the resultant improvement in process yield during the chemical-mechanical polishing of damascene copper interconnects.
机译:1-H苯并三唑(BTA)已用于抑制集成电路加工过程中铜金属化的腐蚀。本文讨论了在加工过程中控制BTA浓度的必要性。它提出了一种快速的在线技术,通过光谱技术监测BTA浓度。以及大马士革铜互连线的化学机械抛光过程中工艺产量的提高。

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