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Dual-Vt design of FPGAs for subthreshold leakage tolerance

机译:FPGA的双Vt设计以实现亚阈值泄漏容限

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In this paper we propose a dual-Vt FPGA architecture for reduction of subthreshold leakage power. A CAD flow has been proposed based on the dual-Vt assignment algorithm and placement for realizing the dual-Vt FPGA architecture. Logic elements within the logic blocks are the candidates for dual-Vt assignment. We propose an architecture in which there are two kinds of logic blocks, one with all high-Vt logic elements and another with a fixed percentage of high-Vt logic elements. These two kinds of logic blocks are then placed in such a way that the FPGA architecture remains regular. Results indicate that in the ideal case of dual-Vt assignment, over 95% of the logic elements can be assigned high-Vt. Results show that leakage savings of 55% can be achieved. Design tradeoffs for various ratios of the two kinds of logic blocks are investigated. The dual-Vt FPGA CAD flow is intended for development and evaluation of dual-Vt FPGA architectures
机译:在本文中,我们提出了一种双Vt FPGA架构,以降低亚阈值泄漏功率。已经提出了一种基于双重Vt分配算法和布局的CAD流程,以实现双重Vt FPGA架构。逻辑块中的逻辑元素是双Vt分配的候选。我们提出一种体系结构,其中有两种逻辑块,一种具有所有高Vt逻辑元素,另一种具有固定百分比的高Vt逻辑元素。然后以使FPGA体系结构保持规则的方式放置这两种逻辑块。结果表明,在理想的双Vt分配情况下,可以为95%以上的逻辑元件分配高Vt。结果表明,可以节省55%的泄漏。研究了两种逻辑块的各种比率的设计折衷。 Dual-Vt FPGA CAD流程旨在用于开发和评估Dual-Vt FPGA架构

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