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Algorithm design, software simulation and mathematical modelling of subthreshold leakage current in CMOS circuits

机译:CMOS电路中亚阈值泄漏电流的算法设计,软件仿真和数学建模

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摘要

In this paper, concepts of mathematics and computer science were applied to electronics engineering field, specifically very large scale integration (VLSI) design and semiconductor industry. Presently one of the major challenges faced by the semiconductor industry is continuously growing leakage current with technology scaling. Transistor is the smallest structural unit of any chip or semiconductor device. Subthreshold leakage current is known as one of the most dominant leakage current components of transistor. In this paper, mathematical relationship between transistor structure and subthreshold leakage current was found. An algorithm was designed for automatic tracking of the transistor structure. Simulation setup was formed by applying some mathematical formula on the outputs of the algorithm. Results of TCAD software simulation were found to be very close to a well known mathematical formula. As complementary metal oxide semiconductor (CMOS) is the most popular technology for semiconductor device fabrication in present days, the same was used for simulation purpose.
机译:本文将数学和计算机科学的概念应用于电子工程领域,尤其是超大规模集成(VLSI)设计和半导体工业。当前,半导体工业面临的主要挑战之一是随着技术的规模不断增加漏电流。晶体管是任何芯片或半导体器件中最小的结构单元。亚阈值泄漏电流被认为是晶体管最主要的泄漏电流分量之一。本文发现了晶体管结构与亚阈值泄漏电流之间的数学关系。设计了一种用于自动跟踪晶体管结构的算法。通过在算法的输出上应用一些数学公式来形成仿真设置。发现TCAD软件仿真的结果非常接近众所周知的数学公式。由于互补金属氧化物半导体(CMOS)是当今最流行的半导体器件制造技术,因此将其用于仿真目的。

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