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Selective uv-laser processing for lift-off of GaN thin films from sapphire substrates

机译:用于从蓝宝石衬底上剥离GaN薄膜的选择性uv激光处理

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摘要

Gallium nitride (GaN) thin films on sapphire substrates were successfully separated and transferred onto Si substrates by pulsed UV-laser processing. A single 600 mJ/cm~2, 38 ns KrF excimer laser pulse was directed through the transparent substrate to induce a rapid thermal decomposition of the GaN at the GaN/sapphire interface. The decomposition yi8elds metallic Ga and N_2 gas that allows separation of the GaN film from the substrate. Three-micron-thick free-standing GaN membranes were also fabricated using the laser life-off technique. Surface roughness of the exposed interfacial layer was meausred to be approx 24 nm (rms) by atomic force microscopy. Photoluminescence measurements of the GaN membranes showed no optical degradation of the GaN after liftoff from the saphire. Based on a 10 meV blue-shift of the donor-bound exciton peak, an estimated biaxial compressive stress of approx 0.4 GPa in the GaN film was relieved by separation from the sapphire growth substrate.
机译:蓝宝石衬底上的氮化镓(GaN)薄膜通过脉冲UV激光处理成功分离并转移到Si衬底上。单个600 mJ / cm〜2、38 ns KrF的准分子激光脉冲穿过透明衬底,从而在GaN /蓝宝石界面处引起GaN的快速热分解。分解产生金属Ga和N_2气体,使GaN膜与衬底分离。还使用激光寿命技术制造了三微米厚的自支撑GaN膜。通过原子力显微镜,暴露的界面层的表面粗糙度被测量为约24nm(rms)。 GaN膜的光致发光测量表明,从蓝宝石提离后,GaN没有光学降解。基于供体结合的激子峰的10 meV蓝移,通过与蓝宝石生长衬底分离,可以缓解GaN膜中估计的大约0.4 GPa的双轴压缩应力。

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