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Highly-efficient Polishing Technology for Glass Substrates Using Tribo-chemical Polishing with Electrically Controlled Slurry

机译:摩擦化学抛光与电控浆料的玻璃基板高效抛光技术

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The outstanding advantage of the novel polishing technology developed by the authors is a considerable reduction in ceriumrnoxide consumption for polishing of glass substrates. This has been realized by introducing tribo-chemical polishing methodrnalong with a technique to control the movement of abrasives using an AC electric field. In this paper, we have analyzed therncharacteristics of the new polishing technique from the viewpoint of slurry distribution in the polishing area under variousrnelectric field conditions using a digital image processing and its influence on polishing performance using the experimentalrnsetup consisting of high speed polishing method under AC electric field. The results confirmed the increase of slurryrndistribution in the polishing area under appropriate AC electric field conditions and consequently led to enhanced removal rate,rnwhich was 2.5 times higher than that of the conventional CMP (Chemical Mechanical polishing) method. Furthermore, in spiternof enhanced removal rate the surface roughness was comparable to CMP method.
机译:作者开发的新型抛光技术的显着优势是可大大减少用于玻璃基板抛光的氧化铈消耗。这是通过引入摩擦化学抛光方法来实现的,该方法具有一种使用交流电场控制磨料运动的技术。本文从数字图像处理技术在不同电场条件下从抛光区域中浆料分布的角度分析了新型抛光技术的特点,并利用交流电高速抛光法组成的实验装置对抛光性能的影响进行了分析。领域。结果证实,在适当的交流电场条件下,抛光液中浆料分布的增加,从而导致去除率提高,比传统的CMP(化学机械抛光)方法高2.5倍。此外,在提高去除率的同时,其表面粗糙度与CMP方法相当。

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