首页> 外文会议>Proceedings of the 2008 international conference on engineering of reconfigurable systems amp; algorithms >An Introduction to Radiation-Induced Failure Modes and Related Mitigation Methods For Xilinx SRAM FPGAs
【24h】

An Introduction to Radiation-Induced Failure Modes and Related Mitigation Methods For Xilinx SRAM FPGAs

机译:Xilinx SRAM FPGA的辐射引起的故障模式和相关的缓解方法简介

获取原文
获取原文并翻译 | 示例

摘要

Using reconfigurable, static random-access memory (SRAM) based field-programmable gate arrays (FPGAs) for space-based computation has been an exciting area of research for the past decade. In comparison with traditional radiation-hardened electronics, these devices would allow spacecrafts to be more adaptive and responsive to changing mission needs. Unfortunately, all commercially available SRAM-based FPGAs have problems with the harsh radiation environment in space. This paper will provide an introduction to the potential radiation-induced faults and possible mitigation methods.
机译:在过去的十年中,使用基于空间的可重构,静态随机存取存储器(SRAM)的现场可编程门阵列(FPGA)进行空间计算一直是令人兴奋的研究领域。与传统的辐射硬化电子设备相比,这些设备将使航天器更具适应性,并能够响应不断变化的任务需求。不幸的是,所有市售的基于SRAM的FPGA都存在太空中恶劣的辐射环境的问题。本文将介绍潜在的辐射诱发的故障以及可能的缓解方法。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号